Browsing by Author "Facsko, S."
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- ItemIntroducing artificial length scales to tailor magnetic properties(Milton Park : Taylor & Francis, 2009) Fassbender, J.; Strache, T.; Liedke, M.O.; Markó, D.; Wintz, S.; Lenz, K.; Keller, A.; Facsko, S.; Mönch, I.; McCord, J.Magnetism is a collective phenomenon. Hence, a local variation on the nanoscale of material properties, which act on the magnetic properties, affects the overall magnetism in an intriguing way. Of particular importance are the length scales on which a material property changes. These might be related to the exchange length, the domain wall width, a typical roughness correlation length, or a length scale introduced by patterning of the material. Here we report on the influence of two artificially created length scales: (i) ion erosion templates that serve as a source of a predefined surface morphology (ripple structure) and hence allow for the investigation of roughness phenomena. It is demonstrated that the ripple wave length can be easily tuned over a wide range (25–175 nm) by varying the primary ion erosion energy. The effect of this ripple morphology on the induced uniaxial magnetic anisotropy in soft magnetic Permalloy films is studied. Only below a ripple wavelength threshold (≈60 nm) is a significant induced magnetic anisotropy found. Above this threshold the corrugated Permalloy film acts as a flat film. This cross-over is discussed in the frame of dipolar interactions giving rise to the induced anisotropies. (ii) Ion implantation through a lithographically defined mask, which is used for a magnetic property patterning on various length scales. The resulting magnetic properties are neither present in non-implanted nor in homogeneously implanted films. Here new insight is gained by the comparison of different stripe patterning widths ranging from 1 to 10 μm. In addition, the appearance of more complicated magnetic domain structures, i.e. spin-flop domain configurations and head-on domain walls, during hard axis magnetization reversal is demonstrated. In both cases the magnetic properties, the magnetization reversal process as well as the magnetic domain configurations depend sensitively on the artificially introduced length scale.
- ItemRecovery of release cloud from laser shock-loaded graphite and hydrocarbon targets: in search of diamonds(Bristol : IOP Publ., 2022) Schuster, A.K.; Voigt, K.; Klemmed, B.; Hartley, N.J.; Lütgert, J.; Zhang, M.; Bähtz, C.; Benad, A.; Brabetz, C.; Cowan, T.; Döppner, T.; Erb, D.J.; Eychmüller, A.; Facsko, S.; Falcone, R.W.; Fletcher, L.B.; Frydrych, S.; Ganzenmüller, G.C.; Gericke, D.O.; Glenzer, S.H.; Grenzer, J.; Helbig, U.; Hiermaier, S.; Hübner, R.; Laso Garcia, A.; Lee, H.J.; MacDonald, M.J.; McBride, E.E.; Neumayer, P.; Pak, A.; Pelka, A.; Prencipe, I.; Prosvetov, A.; Rack, A.; Ravasio, A.; Redmer, R.; Reemts, D.; Rödel, M.; Schoelmerich, M.; Schumacher, D.; Tomut, M.; Turner, S.J.; Saunders, A.M.; Sun, P.; Vorberger, J.; Zettl, A.; Kraus, D.This work presents first insights into the dynamics of free-surface release clouds from dynamically compressed polystyrene and pyrolytic graphite at pressures up to 200 GPa, where they transform into diamond or lonsdaleite, respectively. These ejecta clouds are released into either vacuum or various types of catcher systems, and are monitored with high-speed recordings (frame rates up to 10 MHz). Molecular dynamics simulations are used to give insights to the rate of diamond preservation throughout the free expansion and the catcher impact process, highlighting the challenges of diamond retrieval. Raman spectroscopy data show graphitic signatures on a catcher plate confirming that the shock-compressed PS is transformed. First electron microscopy analyses of solid catcher plates yield an outstanding number of different spherical-like objects in the size range between ten(s) up to hundreds of nanometres, which are one type of two potential diamond candidates identified. The origin of some objects can unambiguously be assigned, while the history of others remains speculative.
- ItemSite-controlled formation of single Si nanocrystals in a buried SiO2 matrix using ion beam mixing(Frankfurt am Main : Beilstein-Institut zur Förderung der Chemischen Wissenschaften, 2018) Xu, X.; Prüfer, T.; Wolf, D.; Engelmann, H.-J.; Bischoff, L.; Hübner, R.; Heinig, K.-H.; Möller, W.; Facsko, S.; von Borany, J.; Hlawacek, G.For future nanoelectronic devices - such as room-temperature single electron transistors - the site-controlled formation of single Si nanocrystals (NCs) is a crucial prerequisite. Here, we report an approach to fabricate single Si NCs via medium-energy Si+ or Ne+ ion beam mixing of Si into a buried SiO2 layer followed by thermally activated phase separation. Binary collision approximation and kinetic Monte Carlo methods are conducted to gain atomistic insight into the influence of relevant experimental parameters on the Si NC formation process. Energy-filtered transmission electron microscopy is performed to obtain quantitative values on the Si NC size and distribution in dependence of the layer stack geometry, ion fluence and thermal budget. Employing a focused Ne+ beam from a helium ion microscope, we demonstrate site-controlled self-assembly of single Si NCs. Line irradiation with a fluence of 3000 Ne+/nm2 and a line width of 4 nm leads to the formation of a chain of Si NCs, and a single NC with 2.2 nm diameter is subsequently isolated and visualized in a few nanometer thin lamella prepared by a focused ion beam (FIB). The Si NC is centered between the SiO2 layers and perpendicular to the incident Ne+ beam.