Browsing by Author "Hoppe, Robert"
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- ItemImaging Shock Waves in Diamond with Both High Temporal and Spatial Resolution at an XFEL([London] : Macmillan Publishers Limited, part of Springer Nature, 2015) Schropp, Andreas; Hoppe, Robert; Meier, Vivienne; Patommel, Jens; Seiboth, Frank; Ping, Yuan; Hicks, Damien G.; Beckwith, Martha A.; Collins, Gilbert W.; Higginbotham, Andrew; Wark, Justin S.; Lee, Hae Ja; Nagler, Bob; Galtier, Eric C.; Arnold, Brice; Zastrau, Ulf; Hastings, Jerome B.; Schroer, Christian G.The advent of hard x-ray free-electron lasers (XFELs) has opened up a variety of scientific opportunities in areas as diverse as atomic physics, plasma physics, nonlinear optics in the x-ray range and protein crystallography. In this article, we access a new field of science by measuring quantitatively the local bulk properties and dynamics of matter under extreme conditions, in this case by using the short XFEL pulse to image an elastic compression wave in diamond. The elastic wave was initiated by an intense optical laser pulse and was imaged at different delay times after the optical pump pulse using magnified x-ray phase-contrast imaging. The temporal evolution of the shock wave can be monitored, yielding detailed information on shock dynamics, such as the shock velocity, the shock front width and the local compression of the material. The method provides a quantitative perspective on the state of matter in extreme conditions.
- ItemScanning X-ray nanodiffraction: From the experimental approach towards spatially resolved scattering simulations(London : BioMed Central, 2012) Dubslaff, Martin; Hanke, Michael; Patommel, Jens; Hoppe, Robert; Schroer, Christian G.; Schöder, Sebastian; Burghammer, ManfredAn enhancement on the method of X-ray diffraction simulations for applications using nanofocused hard X-ray beams is presented. We combine finite element method, kinematical scattering calculations, and a spot profile of the X-ray beam to simulate the diffraction of definite parts of semiconductor nanostructures. The spot profile could be acquired experimentally by X-ray ptychography. Simulation results are discussed and compared with corresponding X-ray nanodiffraction experiments on single SiGe dots and dot molecules.