Browsing by Author "Monecke, Manuel"
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- ItemMagnetooptical response of permalloy multilayer structures on different substrate in the IR-VIS-UV spectral range(Bristol : IOP Publ., 2019) Patra, Rajkumar; Mattheis, Roland; Stöcker, Hartmut; Monecke, Manuel; Salvan, Georgeta; Schäfer, Rudolf; Schmidt, Oliver G.; Schmidt, HeidemarieThe magnetooptical (MO) response of Ru/Py/Ta thin film stacks with 4, 8, and 17 nm thick Ni81Fe19 permalloy (Py) films on a SiO2/Si and a ZnO substrate was measured by vector magnetooptical generalized ellipsometry. The MO response from VMOGE was modelled using a 4 × 4 Mueller matrix algorithm. The wavelength-dependent, substrate-independent and thickness-independent complex MO coupling constant (Q) of Py in the Ru/Py/Ta thin film stacks was extracted by fitting Mueller matrix difference spectra in the spectral range from 300 nm to 1000 nm. Although the composition-dependent saturation magnetization of NixFe1−x alloys (x = 0.0...1.0), e.g. of Ni81Fe19, is predictable from the two saturation magnetization end points, the MO coupling constant of NixFe1−x is not predictable from the two Q end points. However, in a small alloy range (0.0 < x < 0.2 and 0.8 < x < 1.0) the composition-dependent Q of NixFe1−x can be interpolated from a sufficiently high number of analyzed NixFe1−x alloys. The available complex MO coupling constants of six different NixFe1−x (x = 1.0 to 0.0) alloys were used to interpolate MO response of binary NixFe1−x alloys in the range from x = 0.0 to x = 1.0.
- ItemOptical properties and electrical transport of thin films of terbium(III) bis(phthalocyanine) on cobalt(Frankfurt, M. : Beilstein-Institut zur Förderung der Chemischen Wissenschaften, 2014) Robaschik, Peter; Siles, Pablo F.; Bülz, Daniel; Richter, Peter; Monecke, Manuel; Fronk, Michael; Klyatskaya, Svetlana; Grimm, Daniel; Schmidt, Oliver G.; Ruben, Mario; Zahn, Dietrich R.T.; Salvan, GeorgetaThe optical and electrical properties of terbium(III) bis(phthalocyanine) (TbPc2) films on cobalt substrates were studied using variable angle spectroscopic ellipsometry (VASE) and current sensing atomic force microscopy (cs-AFM). Thin films of TbPc2 with a thickness between 18 nm and 87 nm were prepared by organic molecular beam deposition onto a cobalt layer grown by electron beam evaporation. The molecular orientation of the molecules on the metallic film was estimated from the analysis of the spectroscopic ellipsometry data. A detailed analysis of the AFM topography shows that the TbPc2 films consist of islands which increase in size with the thickness of the organic film. Furthermore, the cs-AFM technique allows local variations of the organic film topography to be correlated with electrical transport properties. Local current mapping as well as local I–V spectroscopy shows that despite the granular structure of the films, the electrical transport is uniform through the organic films on the microscale. The AFMbased electrical measurements allow the local charge carrier mobility of the TbPc2 thin films to be quantified with nanoscale resolution.