Browsing by Author "Seyller, Thomas"
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- ItemQuantitative multichannel NC-AFM data analysis of graphene growth on SiC(0001)(Frankfurt am Main : Beilstein-Institut, 2012) Held, Christian; Seyller, Thomas; Bennewitz, RolandNoncontact atomic force microscopy provides access to several complementary signals, such as topography, damping, and contact potential. The traditional presentation of such data sets in adjacent figures or in colour-coded pseudo-three-dimensional plots gives only a qualitative impression. We introduce two-dimensional histograms for the representation of multichannel NC-AFM data sets in a quantitative fashion. Presentation and analysis are exemplified for topography and contact-potential data for graphene grown epitaxially on 6H-SiC(0001), as recorded by Kelvin probe force microscopy in ultrahigh vacuum. Sample preparations by thermal decomposition in ultrahigh vacuum and in an argon atmosphere are compared and the respective growth mechanisms discussed.