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    <doi>https://doi.org/10.1088/1361-6595/ae4d88</doi>
    <renateDoi>https://doi.org/10.34657/39517</renateDoi>
    <title>Experimentally informed modelling of argon dielectric barrier discharge</title>
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      <sentence id="s34" text="The electron energy flux Γ ε is given by: where µ ε is the energy mobility and D ε is the energy diffusivity .">
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      <sentence id="s35" text="The electron density and electron energy density are computed by solving a pair of drift-diffusion equations, equation (1) and: The mean electron energy is computed via The electron diffusivity, energy diffusivity and energy mobility are computed from the electron mobility as the following: The source terms R e and R ε in the drift-diffusion equations ( 2) and (1) are determined by the plasma chemistry .">
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      <sentence id="s36" text="The electron source term is obtained by summing the production and loss of electrons across all relevant reactions: x j k j N n n e , where x j is the mole fraction of the target species for reaction j, k j is the reaction rate coefficient for reaction j and N n is the total neutral number density .">
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          <entity id="e194" type="G#PhysicalQuantity" text="mass" start="44" end="45" orig_id="155"/>
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      <sentence id="s43" text="The SEEC is notoriously difficult to quantify and depends strongly on the surface oxidation, roughness and contamination, as well as on the incident ion energy; moreover, it can be unintentionally increased by up to 0.5 through standard procedures such as ultrasonic cleaning [33] .">
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      <sentence id="s44" text="In Comsol, SEEC is specified as a constant, whereas in reality it depends on the ion energy and is expected to vary considerably both temporally and spatially [34] .">
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          <entity id="e229" type="G#PhysicalQuantity" text="ion energy" start="15" end="17" orig_id="186"/>
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      <sentence id="s45" text="In this work, the SEEC values are taken as γ glass = 0.15 for the soda-lime glass dielectric [35] and γ Al = 0.02 for the aluminium ground electrode (GND) [36] .">
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      <sentence id="s51" text="The loss of heavy species due to surface reactions and the electric field is described by: where n • J k is the normal component of the k species density at the wall, M k is its molecular weight, R k is the sum of species' surface reaction rates, c k is its molar concentration, z k is the species' charge number and µ k is its mobility .">
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      <sentence id="s53" text="Surface charge accumulation at the dielectric is described by the following equation: where D 1 and D 2 are the displacement fields on both sides of the dielectric boundary and ρ s is the surface charge density which is computed by solving: in which the first and the second terms are the normal components of the total ion and total electron current density at the wall, respectively .">
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      <keyword>applied voltage pulse frequencies</keyword>
      <keyword>voltage rise time</keyword>
      <keyword>intenllical 2 0</keyword>
      <keyword>circuit plasma feedback</keyword>
      <keyword>external electric field</keyword>
      <keyword>soda lime glass dielectric</keyword>
      <keyword>oes line ratios</keyword>
      <keyword>pre breakdown instabilities</keyword>
      <keyword>charged particle densities</keyword>
      <keyword>electron thermal velocity</keyword>
      <keyword>stokes flow regime</keyword>
      <keyword>surface reaction rates</keyword>
      <keyword>gain of electrons</keyword>
      <keyword>negative screening charge</keyword>
      <keyword>Low Temperature Plasma Research</keyword>
    </keywords>
  </annotations>
</document>
