CC BY 3.0 UnportedFrigge, T.Hafke, B.Tinnemann, V.Witte, T.Horn-von Hoegen, M.2022-07-222022-07-222015https://oa.tib.eu/renate/handle/123456789/9770https://doi.org/10.34657/8808Ultrafast high energy electron diffraction in reflection geometry is employed to study the structural dynamics of self-organized Germanium hut-, dome-, and relaxed clusters on Si(001) upon femtosecond laser excitation. Utilizing the difference in size and strain state the response of hut- and dome clusters can be distinguished by a transient spot profile analysis. Surface diffraction from {105}-type facets provide exclusive information on hut clusters. A pixel-by-pixel analysis of the dynamics of the entire diffraction pattern gives time constants of 40, 160, and 390 ps, which are assigned to the cooling time constants for hut-, dome-, and relaxed clusters.enghttps://creativecommons.org/licenses/by/3.0/530500DomesElectron diffractionPixelsStructural dynamicsCooling time constantsGe nanostructuresLifetime mappingReflection geometrySpot profile analysisSurface diffractionTime constantsUltrafast electron diffractionLaser excitationSpot profile analysis and lifetime mapping in ultrafast electron diffraction: Lattice excitation of self-organized Ge nanostructures on Si(001)Article