Browsing by Author Davtyan, Arman
Showing results 1 to 5 of 5
| Issue Date | Title | Author(s) |
| 2020 | Beam damage of single semiconductor nanowires during X-ray nanobeam diffraction experiments | Al Hassan, Ali; Lähnemann, Jonas; Davtyan, Arman; Al-Humaidi, Mahmoud; Herranz, Jesús; Bahrami, Danial; Anjum, Taseer; Bertram, Florian; Dey, Arka Bikash; Geelhaar, Lutz; Pietsch, Ullrich |
| 2022 | Exploiting flux shadowing for strain and bending engineering in core-shell nanowires | Al Humaidi, Mahmoud; Jakob, Julian; Al Hassan, Ali; Davtyan, Arman; Schroth, Philipp; Feigl, Ludwig; Herranz, Jesús; Novikov, Dmitri; Geelhaar, Lutz; Baumbach, Tilo; Pietsch, Ullrich |
| 2021 | Impact of Electrical Current on Single GaAs Nanowire Structure | Bahrami, Danial; AlHassan, Ali; Davtyan, Arman; Zhe, Ren; Anjum, Taseer; Herranz, Jesús; Geelhaar, Lutz; Novikov, Dmitri V.; Timm, Rainer; Pietsch, Ullrich |
| 2017 | Threefold rotational symmetry in hexagonally shaped core–shell (In,Ga)As/GaAs nanowires revealed by coherent X-ray diffraction imaging | Davtyan, Arman; Krause, Thilo; Kriegner, Dominik; Al-Hassan, Ali; Bahrami, Danial; Mostafavi Kashani, Seyed Mohammad; Lewis, Ryan B.; Küpers, Hanno; Tahraoui, Abbes; Geelhaar, Lutz; Hanke, Michael; Leake, Steven John; Loffeld, Otmar; Pietsch, Ullrich |
| 2020 | X-ray diffraction reveals the amount of strain and homogeneity of extremely bent single nanowires | Davtyan, Arman; Kriegner, Dominik; Holý, Václav; AlHassan, Ali; Lewis, Ryan B.; McDermott, Spencer; Geelhaar, Lutz; Bahrami, Danial; Anjum, Taseer; Ren, Zhe; Richter, Carsten; Novikov, Dmitri; Müller, Julian; Butz, Benjamin; Pietsch, Ullrich |
