Browsing by Author Zwiebler, M.
Showing results 1 to 1 of 1
| Issue Date | Title | Author(s) |
| 2015 | Electronic depth profiles with atomic layer resolution from resonant soft x-ray reflectivity | Zwiebler, M.; Hamann-Borrero, J.E.; Vafaee, M.; Komissinskiy, P.; Macke, S.; Sutarto, R.; He, F.; Büchner, B.; Sawatzky, G.A.; Alff, L.; Geck, J. |
