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Issue DateTitleAuthor(s)
2009An X-Band low-power and low-phase-noise VCO using bondwire inductorHu, K.; Herzel, F.; Scheytt, J.C.
2013X-ray characterization of Ge dots epitaxially grown on nanostructured Si islands on silicon-on-insulator substratesZaumseil, Peter; Kozlowski, Grzegorz; Yamamoto, Yuji; Schubert, Markus Andreas; Schroeder, Thomas
2016X-ray computed tomography investigation of structures in Opalinus Clay fromlarge-scale to small-scale after mechanical testingKaufhold, Annette; Halisch, Matthias; Zacher, Gerhard; Kaufhold, Stephan
2020X-ray diffraction from strongly bent crystals and spectroscopy of X-ray free-electron laser pulsesKaganer, Vladimir M.; Petrov, Ilia; Samoylova, Liubov
2020X-ray diffraction reveals the amount of strain and homogeneity of extremely bent single nanowiresDavtyan, Arman; Kriegner, Dominik; Holý, Václav; AlHassan, Ali; Lewis, Ryan B.; McDermott, Spencer; Geelhaar, Lutz; Bahrami, Danial; Anjum, Taseer; Ren, Zhe; Richter, Carsten; Novikov, Dmitri; Müller, Julian; Butz, Benjamin; Pietsch, Ullrich
2023X-ray emission from a rapidly accreting narrow-line Seyfert 1 galaxy at z = 6.56Wolf, J.; Nandra, K.; Salvato, M.; Buchner, J.; Onoue, M.; Liu, T.; Arcodia, R.; Merloni, A.; Ciroi, S.; Di Mille, F.; Burwitz, V.; Brusa, M.; Ishimoto, R.; Kashikawa, N.; Matsuoka, Y.; Urrutia, T.; Waddell, S.G.H.
2014X-ray imaging of chemically active valence electrons during a pericyclic reactionBredtmann, T.; Ivanov, M.; Dixit, G.
2015X-ray imaging with scintillator-sensitized hybrid organic photodetectorsBüchele, Patric; Richter, Moses; Tedde, Sandro F.; Matt, Gebhard J.; Ankah, Genesis N.; Fischer, Rene; Biele, Markus; Metzger, Wilhelm; Lilliu, Samuele; Bikondoa, Oier; Macdonald, J. Emyr; Brabec, Christoph J.; Kraus, Tobias; Lemmer, Uli; Schmidt, Oliver
2011The x-ray luminous galaxy cluster population at 0.9 < z ≲ 1.6 as revealed by the XMM-Newton Distant Cluster Project*Fassbender, R.; Böhringer, H.; Nastasi, A.; Šuhada, R.; Mühlegger, M.; De Hoon, A.; Kohnert, J.; Lamer, G.; Mohr, J.J.; Pierini, D.; Pratt, G.W.; Quintana, H.; Rosati, P.; Santos, J.S.; Schwope, A.D.
2011X-ray nanodiffraction on a single SiGe quantum dot inside a functioning field-effect transistorHrauda, N.; Zhang, J.; Wintersberger, E.; Etzelstorfer, T.; Mandl, B.; Stangl, J.; Carbone, D.; Holý, V.; Jovanović, V.; Biasotto, C.; Nanver, L.K.; Moers, J.; Grützmacher, D.; Bauer, G.
2022X-ray Ptychographic Imaging and Spectroscopic Studies of Plasma-Treated Plastic FilmsRavandeh, Mehdi; Mehrjoo, Masoud; Kharitonov, Konstantin; Schäfer, Jan; Quade, Antje; Honnorat, Bruno; Ruiz-Lopez, Mabel; Keitel, Barbara; Kreis, Svea; Pan, Rui; Gang, Seung-gi; Wende, Kristian; Plönjes, Elke
2021X-ray quasi-periodic eruptions from two previously quiescent galaxiesArcodia, R.; Merloni, A.; Nandra, K.; Buchner, J.; Salvato, M.; Pasham, D.; Remillard, R.; Comparat, J.; Lamer, G.; Ponti, G.; Malyali, A.; Wolf, J.; Arzoumanian, Z.; Bogensberger, D.; Buckley, D.A.H.; Gendreau, K.; Gromadzki, M.; Kara, E.; Krumpe, M.; Markwardt, C.; Ramos-Ceja, M.E.; Rau, A.; Schramm, M.; Schwope, A.
2020-06-13X-Sprint: Climate and Migration - 100% Open Research for Climate ChangeWorthington, Simon
2020xCT (SLC7A11) expression confers intrinsic resistance to physical plasma treatment in tumor cellsBekeschus, Sander; Eisenmann, Sebastian; Sagwal, Sanjeev Kumar; Bodnar, Yana; Moritz, Juliane; Poschkamp, Broder; Stoffels, Ingo; Emmert, Steffen; Madesh, Muniswamy; Weltmann, Klaus-Dieter; von Woedtke, Thomas; Gandhirajan, Rajesh Kumar
2020XEL Group Learning – A Socio-technical Framework for Self-regulated LearningEid, Shereif; Kismihók, Gábor; Lane, H. Chad; Zvacek, Susan; Uhomoibhi, James
2020The XMM-Newton serendipitous survey : IX. The fourth XMM-Newton serendipitous source catalogueWebb, N.A.; Coriat, M.; Traulsen, I.; Ballet, J.; Motch, C.; Carrera, F.J.; Koliopanos, F.; Authier, J.; de la Calle, I.; Ceballos, M.T.; Colomo, E.; Chuard, D.; Freyberg, M.; Garcia, T.; Kolehmainen, M.; Lamer, G.; Lin, D.; Maggi, P.; Michel, L.; Page, C.G.; Page, M.J.; Perea-Calderon, J.V.; Pineau, F.-X.; Rodriguez, P.; Rosen, S.R.; Santos Lleo, M.; Saxton, R.D.; Schwope, A.; Tomás, L.; Watson, M.G.; Zakardjian, A.
2020XPS chemical state analysis of sputter depth profiling measurements for annealed TiAl-SiO2 and TiAl-W layer stacksOswald, Steffen; Lattner, Eric; Seifert, Marietta
2018XPS investigations of MOCVD tin oxide thin layers on Si nanowires arrayTurishchev, S.Yu.; Chuvenkova, Olga; Parinova, V.E.; Koyuda, D.A.; Chumakov, Ratibor G.; Presselt, Martin; Schleusener, Alexander; Sivakov, Vladimir
2018-8-3XUV double-pulses with femtosecond to 650 ps separation from a multilayer-mirror-based split-and-delay unit at FLASHSauppe, Mario; Rompotis, Dimitrios; Erk, Benjamin; Bari, Sadia; Bischoff, Tobias; Boll, Rebecca; Bomme, Cédric; Bostedt, Christoph; Dörner, Simon; Düsterer, Stefan; Feigl, Torsten; Flückiger, Leonie; Gorkhover, Tais; Kolatzki, Katharina; Langbehn, Bruno; Monserud, Nils; Müller, Erland; Müller, Jan P.; Passow, Christopher; Ramm, Daniel; Rolles, Daniel; Schubert, Kaja; Schwob, Lucas; Senfftleben, Björn; Treusch, Rolf; Ulmer, Anatoli; Weigelt, Holger; Zimbalski, Jannis; Zimmermann, Julian; Möller, Thomas; Rupp, Daniela
2015XUV excitation followed by ultrafast non-adiabatic relaxation in PAH molecules as a femto-astrochemistry experimentMarciniak, A.; Despré, V.; Barillot, T.; Rouzée, A.; Galbraith, M.C.E.; Klei, J.; Yang, C.-H.; Smeenk, C.T.L.; Loriot, V.; Nagaprasad Reddy, S.; Tielens, A.G.G.M.; Mahapatra, S.; Kuleff, A.I.; Vrakking, M.J.J.; Lépine, F.