High-Pressure-Sintering-Induced Microstructural Engineering for an Ultimate Phonon Scattering of Thermoelectric Half-Heusler Compounds

dc.bibliographicCitation.firstPage2102045eng
dc.bibliographicCitation.issue33eng
dc.bibliographicCitation.volume17eng
dc.contributor.authorHe, Ran
dc.contributor.authorZhu, Taishan
dc.contributor.authorYing, Pingjun
dc.contributor.authorChen, Jie
dc.contributor.authorGiebeler, Lars
dc.contributor.authorKühn, Uta
dc.contributor.authorGrossman, Jeffrey C.
dc.contributor.authorWang, Yumei
dc.contributor.authorNielsch, Kornelius
dc.date.accessioned2022-04-19T10:53:31Z
dc.date.available2022-04-19T10:53:31Z
dc.date.issued2021
dc.description.abstractThermal management is of vital importance in various modern technologies such as portable electronics, photovoltaics, and thermoelectric devices. Impeding phonon transport remains one of the most challenging tasks for improving the thermoelectric performance of certain materials such as half-Heusler compounds. Herein, a significant reduction of lattice thermal conductivity (κL) is achieved by applying a pressure of ≈1 GPa to sinter a broad range of half-Heusler compounds. Contrasting with the common sintering pressure of less than 100 MPa, the gigapascal-level pressure enables densification at a lower temperature, thus greatly modifying the structural characteristics for an intensified phonon scattering. A maximum κL reduction of ≈83% is realized for HfCoSb from 14 to 2.5 W m−1 K−1 at 300 K with more than 95% relative density. The realized low κL originates from a remarkable grain-size refinement to below 100 nm together with the abundant in-grain defects, as determined by microscopy investigations. This work uncovers the phonon transport properties of half-Heusler compounds under unconventional microstructures, thus showing the potential of high-pressure compaction in advancing the performance of thermoelectric materials.eng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/8720
dc.identifier.urihttps://doi.org/10.34657/7758
dc.language.isoengeng
dc.publisherWeinheim : Wiley-VCHeng
dc.relation.doihttps://doi.org/10.1002/smll.202102045
dc.relation.essn1613-6829
dc.relation.ispartofseriesSmall : nano micro 17 (2021), Nr. 33eng
dc.rights.licenseCC BY-NC-ND 4.0 Unportedeng
dc.rights.urihttps://creativecommons.org/licenses/by-nc-nd/4.0/eng
dc.subjecthalf-Heusler compoundseng
dc.subjecthigh-pressure sinteringeng
dc.subjectlattice thermal conductivityeng
dc.subjectthermoelectric deviceseng
dc.subject.ddc570eng
dc.subject.ddc620eng
dc.titleHigh-Pressure-Sintering-Induced Microstructural Engineering for an Ultimate Phonon Scattering of Thermoelectric Half-Heusler Compoundseng
dc.typearticleeng
dc.typeTexteng
dcterms.bibliographicCitation.journalTitleSmall : nano microeng
tib.accessRightsopenAccesseng
wgl.contributorIFWDeng
wgl.subjectBiowissensschaften/Biologieeng
wgl.typeZeitschriftenartikeleng
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