Classifying multi-model wheat yield impact response surfaces showing sensitivity to temperature and precipitation change

dc.bibliographicCitation.date2018
dc.bibliographicCitation.firstPage209
dc.bibliographicCitation.journalTitleAgricultural Systemseng
dc.bibliographicCitation.lastPage224
dc.bibliographicCitation.volume159
dc.contributor.authorFronzek, Stefan
dc.contributor.authorPirttioja, Nina
dc.contributor.authorCarter, Timothy R.
dc.contributor.authorBindi, Marco
dc.contributor.authorHoffmann, Holger
dc.contributor.authorPalosuo, Taru
dc.contributor.authorRuiz-Ramos, Margarita
dc.contributor.authorTao, Fulu
dc.contributor.authorTrnka, Miroslav
dc.contributor.authorAcutis, Marco
dc.contributor.authorAsseng, Senthold
dc.contributor.authorBaranowski, Piotr
dc.contributor.authorBasso, Bruno
dc.contributor.authorBodin, Per
dc.contributor.authorBuis, Samuel
dc.contributor.authorCammarano, Davide
dc.contributor.authorDeligios, Paola
dc.contributor.authorDestain, Marie-France
dc.contributor.authorDumont, Benjamin
dc.contributor.authorEwert, Frank
dc.contributor.authorFerrise, Roberto
dc.contributor.authorFrançois, Louis
dc.contributor.authorGaiser, Thomas
dc.contributor.authorHlavinka, Petr
dc.contributor.authorJacquemin, Ingrid
dc.contributor.authorKersebaum, Kurt Christian
dc.contributor.authorKollas, Chris
dc.contributor.authorKrzyszczak, Jaromir
dc.contributor.authorLorite, Ignacio J.
dc.contributor.authorMinet, Julien
dc.contributor.authorMinguez, M. Ines
dc.contributor.authorMontesino, Manuel
dc.contributor.authorMoriondo, Marco
dc.contributor.authorMüller, Christoph
dc.contributor.authorNendel, Claas
dc.contributor.authorÖztürk, Isik
dc.contributor.authorPerego, Alessia
dc.contributor.authorRodríguez, Alfredo
dc.contributor.authorRuane, Alex C.
dc.contributor.authorRuget, Françoise
dc.contributor.authorSanna, Mattia
dc.contributor.authorSemenov, Mikhail A.
dc.contributor.authorSlawinski, Cezary
dc.contributor.authorStratonovitch, Pierre
dc.contributor.authorSupit, Iwan
dc.contributor.authorWaha, Katharina
dc.contributor.authorWang, Enli
dc.contributor.authorWu, Lianhai
dc.contributor.authorZhao, Zhigan
dc.contributor.authorRötter, Reimund P.
dc.date.accessioned2023-01-16T13:46:07Z
dc.date.available2023-01-16T13:46:07Z
dc.date.issued2017
dc.description.abstractCrop growth simulation models can differ greatly in their treatment of key processes and hence in their response to environmental conditions. Here, we used an ensemble of 26 process-based wheat models applied at sites across a European transect to compare their sensitivity to changes in temperature (−2 to +9°C) and precipitation (−50 to +50%). Model results were analysed by plotting them as impact response surfaces (IRSs), classifying the IRS patterns of individual model simulations, describing these classes and analysing factors that may explain the major differences in model responses. The model ensemble was used to simulate yields of winter and spring wheat at four sites in Finland, Germany and Spain. Results were plotted as IRSs that show changes in yields relative to the baseline with respect to temperature and precipitation. IRSs of 30-year means and selected extreme years were classified using two approaches describing their pattern. The expert diagnostic approach (EDA) combines two aspects of IRS patterns: location of the maximum yield (nine classes) and strength of the yield response with respect to climate (four classes), resulting in a total of 36 combined classes defined using criteria pre-specified by experts. The statistical diagnostic approach (SDA) groups IRSs by comparing their pattern and magnitude, without attempting to interpret these features. It applies a hierarchical clustering method, grouping response patterns using a distance metric that combines the spatial correlation and Euclidian distance between IRS pairs. The two approaches were used to investigate whether different patterns of yield response could be related to different properties of the crop models, specifically their genealogy, calibration and process description. Although no single model property across a large model ensemble was found to explain the integrated yield response to temperature and precipitation perturbations, the application of the EDA and SDA approaches revealed their capability to distinguish: (i) stronger yield responses to precipitation for winter wheat than spring wheat; (ii) differing strengths of response to climate changes for years with anomalous weather conditions compared to period-average conditions; (iii) the influence of site conditions on yield patterns; (iv) similarities in IRS patterns among models with related genealogy; (v) similarities in IRS patterns for models with simpler process descriptions of root growth and water uptake compared to those with more complex descriptions; and (vi) a closer correspondence of IRS patterns in models using partitioning schemes to represent yield formation than in those using a harvest index. Such results can inform future crop modelling studies that seek to exploit the diversity of multi-model ensembles, by distinguishing ensemble members that span a wide range of responses as well as those that display implausible behaviour or strong mutual similarities.eng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/10869
dc.identifier.urihttp://dx.doi.org/10.34657/9895
dc.language.isoeng
dc.publisherAmsterdam [u.a.] : Elsevier
dc.relation.doihttps://doi.org/10.1016/j.agsy.2017.08.004
dc.relation.essn0308-521X
dc.rights.licenseCC BY-NC-ND 4.0 Unported
dc.rights.urihttps://creativecommons.org/licenses/by-nc-nd/4.0/
dc.subject.ddc630
dc.subject.ddc640
dc.subject.otherClassificationeng
dc.subject.otherClimate changeeng
dc.subject.otherCrop modeleng
dc.subject.otherEnsembleeng
dc.subject.otherSensitivity analysiseng
dc.subject.otherWheateng
dc.titleClassifying multi-model wheat yield impact response surfaces showing sensitivity to temperature and precipitation changeeng
dc.typeArticleeng
dc.typeTexteng
tib.accessRightsopenAccess
wgl.contributorPIK
wgl.subjectBiowissenschaften/Biologieger
wgl.typeZeitschriftenartikelger
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