Microstructure Evaluation and Impurities in La Containing Silicon Oxynitrides

dc.bibliographicCitation.firstPage1896eng
dc.bibliographicCitation.issue8eng
dc.bibliographicCitation.journalTitleNanomaterials : open access journaleng
dc.bibliographicCitation.volume11eng
dc.contributor.authorHakeem, Abbas Saeed
dc.contributor.authorAli, Sharafat
dc.contributor.authorHöche, Thomas
dc.contributor.authorDrmosh, Qasem Ahmed
dc.contributor.authorKhan, Amir Azam
dc.contributor.authorJonson, Bo
dc.date.accessioned2022-03-30T04:55:35Z
dc.date.available2022-03-30T04:55:35Z
dc.date.issued2021
dc.description.abstractOxynitride glasses are not yet commercialised primarily due to the impurities present in the network of these glasses. In this work, we investigated the microstructure and instinctive defects in nitrogen rich La-Si-O-N glasses. Glasses were prepared by heating a powder mixture of pure La metal, Si3N4, and SiO2 in a nitrogen atmosphere at 1650-1800 °C. The microstructure and impurities in the glasses were examined by optical microscopy, scanning electron microscopy, atomic force microscopy, and transmission electron microscopy in conjunction with electron energy-loss spectroscopy. Analyses showed that the glasses contain a small amount of spherical metal silicide particles, mostly amorphous or poorly crystalline, and having sizes typically ranging from 1 µm and less. The amount of silicide was estimated to be less than 2 vol. %. There was no systematic relation between silicide formation and glass composition or preparation temperature. The microstructure examination revealed that the opacity of these nitrogen rich glasses is due to the elemental Si arise from the decomposition reaction of silicon nitride and silicon oxide, at a high temperature above ~1600 °C and from the metallic silicide particles formed by the reduction of silicon oxide and silicon nitride at an early stage of reaction to form a silicide intermetallic with the La metal.eng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/8454
dc.identifier.urihttps://doi.org/10.34657/7492
dc.language.isoengeng
dc.publisherBasel : MDPIeng
dc.relation.doihttps://doi.org/10.3390/nano11081896
dc.relation.essn2079-4991
dc.rights.licenseCC BY 4.0 Unportedeng
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/eng
dc.subject.ddc570eng
dc.subject.ddc540eng
dc.subject.otherCharacterisationeng
dc.subject.otherDefectseng
dc.subject.otherElectron microscopyeng
dc.subject.otherNitrogen enricheng
dc.subject.otherOxynitride glasseng
dc.subject.otherTransparencyeng
dc.titleMicrostructure Evaluation and Impurities in La Containing Silicon Oxynitrideseng
dc.typeArticleeng
dc.typeTexteng
tib.accessRightsopenAccesseng
wgl.contributorIOMeng
wgl.subjectBiowissensschaften/Biologieeng
wgl.typeZeitschriftenartikeleng
Files
Original bundle
Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
Microstructure_evaluation_and_impurities.pdf
Size:
4.93 MB
Format:
Adobe Portable Document Format
Description: