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Kelvin probe force microscopy of charged indentation-induced dislocation structures in KBr

2009, Egberts, Philip, Bennewitz, Roland

The incipient stages of plasticity in KBr single crystals have been examined in ultrahigh vacuum by means of Atomic Force Microscopy and Kelvin Probe Force Microscopy (KPFM). Conducting diamond-coated tips have been used to both indent the crystals and image the resulting plastic deformation. KPFM reveals that edge dislocations intersecting the surface carry a negative charge similar to kinks in surface steps, while screw dislocations show no contrast. Weak topographic features extending in <110> direction from the indentation are identified by atomic-resolution imaging to be pairs of edge dislocations of opposite sign, separated by a distance similar to the indenter radius. They indicate the glide of two parallel {110} planes perpendicular to the surface, a process that allows for a slice of KBr to be pushed away from the indentation site.