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- ItemEngineering an achromatic Bessel beam using a phase-only spatial light modulator and an iterative Fourier transformation algorithm(Amsterdam [u.a.] : Elsevier, 2016) Walde, Marie; Jost, Aurélie; Wicker, Kai; Heintzmann, RainerBessel illumination is an established method in optical imaging and manipulation to achieve an extended depth of field without compromising the lateral resolution. When broadband or multicolour imaging is required, wavelength-dependent changes in the radial profile of the Bessel illumination can complicate further image processing and analysis. We present a solution for engineering a multicolour Bessel beam that is easy to implement and promises to be particularly useful for broadband imaging applications. A phase-only spatial light modulator (SLM) in the image plane and an iterative Fourier Transformation algorithm (IFTA) are used to create an annular light distribution in the back focal plane of a lens. The 2D Fourier transformation of such a light ring yields a Bessel beam with a constant radial profile for different wavelength.
- ItemOptical Sectioning and High Resolution in Single-Slice Structured Illumination Microscopy by Thick Slice Blind-SIM Reconstruction(San Francisco, California, US : PLOS, 2015) Jost, Aurélie; Tolstik, Elen; Feldmann, Polina; Wicker, Kai; Sentenac, Anne; Heintzmann, Rainer; Degtyar, Vadim E.The microscope image of a thick fluorescent sample taken at a given focal plane is plagued by out-of-focus fluorescence and diffraction limited resolution. In this work, we show that a single slice of Structured Illumination Microscopy (two or three beam SIM) data can be processed to provide an image exhibiting tight sectioning and high transverse resolution. Our reconstruction algorithm is adapted from the blind-SIM technique which requires very little knowledge of the illumination patterns. It is thus able to deal with illumination distortions induced by the sample or illumination optics. We named this new algorithm thick slice blind-SIM because it models a three-dimensional sample even though only a single two-dimensional plane of focus was measured.