Search Results
The Impact of AlN Templates on Strain Relaxation Mechanisms during the MOVPE Growth of UVB-LED Structures
2020, Knauer, Arne, Mogilatenko, Anna, Weinrich, Jonas, Hagedorn, Sylvia, Walde, Sebastian, Kolbe, Tim, Cancellara, Leonardo, Weyers, Markus
Strain relaxation mechanisms in AlGaN based light emitting diodes emitting in the ultraviolet B spectral range (UVB-LEDs) grown on different AlN/sapphire templates are analyzed by combining in situ reflectivity and curvature data with transmission electron microscopy. In particular, the impact of dislocation density, surface morphology, and lattice constant of the AlN/sapphire templates is studied. For nonannealed AlN/templates with threading dislocation densities (TDDs) of 4 × 109 and 3 × 109 cm−2 and different surface morphologies strain relaxation takes place mostly by conventional ways, such as inclination of threading dislocation lines and formation of horizontal dislocation bands. In contrast, a TDD reduction down to 1 × 109 cm−2 as well as a reduction of the lattice constant of high temperature annealed AlN template leads to drastic changes in the structure of subsequently grown AlGaN layers, e.g., to transformation to helical dislocations and enhanced surface enlargement by formation of macrofacets. For the growth of strongly compressively strained AlGaN layers for UVB-LEDs the relaxation mechanism is strongly influenced by the absolute values of TDD and the lattice constant of the AlN templates and is less influenced by their surface morphology.
Improved Efficiency of Ultraviolet B Light-Emitting Diodes with Optimized p-Side
2020, Kolbe, Tim, Knauer, Arne, Rass, Jens, Cho, Hyun Kyong, Mogilatenko, Anna, Hagedorn, Sylvia, Lobo Ploch, Neysha, Einfeldt, Sven, Weyers, Markus
The effects of design and thicknesses of different optically transparent p-current spreading layers [short-period superlattice, superlattice (SL), and bulk p- (Formula presented.)] as well as the type and thickness of the p-GaN cap layer on the electrical and optical characteristics of 310 nm ultraviolet light-emitting diodes (LEDs) are investigated. Scanning transmission electron microscopy measurements display self-organized composition variations in the nonpseudomorphically grown SLs, reducing the effect of increased hole injection efficiency of a SL. In addition, the effect leads to an increased operation voltage. In contrast, the bulk p-AlGaN layer has a uniform composition and the corresponding LEDs show only a slightly lower output power along with a lower operating voltage. If the thickness of the p-AlGaN bulk layer in the LED is reduced from 150 nm to 50 nm, the output power increases and the operating voltage decreases. Finally, LEDs with a nonuniform (Formula presented.) -GaN cap layer from a 3D island-like growth mode feature the highest output power and operating voltage. In contrast, the output power and operating voltage of LEDs with a smooth and closed cap depend on the thickness of (Formula presented.) -GaN. The highest output power and lowest operating voltage are achieved for LEDs with the thinnest (Formula presented.) -GaN cap. © 2020 The Authors. Published by Wiley-VCH GmbH
Effect of electron blocking layer doping and composition on the performance of 310 nm light emitting diodes
2017, Kolbe, Tim, Knauer, Arne, Rass, Jens, Cho, Hyun Kyong, Hagedorn, Sylvia, Einfeldt, Sven, Kneissl, Michael, Weyers, Markus
The effects of composition and p-doping profile of the AlGaN:Mg electron blocking layer (EBL) in 310 nm ultraviolet B (UV-B) light emitting diodes (LEDs) have been investigated. The carrier injection and internal quantum efficiency of the LEDs were simulated and compared to electroluminescence measurements. The light output power depends strongly on the temporal biscyclopentadienylmagnesium (Cp 2 Mg) carrier gas flow profile during growth as well as on the aluminum profile of the AlGaN:Mg EBL. The highest emission power has been found for an EBL with the highest Cp 2 Mg carrier gas flow and a gradually decreasing aluminum content in direction to the p-side of the LED. This effect is attributed to an improved carrier injection and confinement that prevents electron leakage into the p-doped region of the LED with a simultaneously enhanced carrier injection into the active region.
Status and Prospects of AlN Templates on Sapphire for Ultraviolet Light-Emitting Diodes
2020, Hagedorn, Sylvia, Walde, Sebastian, Knauer, Arne, Susilo, Norman, Pacak, Daniel, Cancellara, Leonardo, Netzel, Carsten, Mogilatenko, Anna, Hartmann, Carsten, Wernicke, Tim, Kneissl, Michael, Weyers, Markus
Herein, the scope is to provide an overview on the current status of AlN/sapphire templates for ultraviolet B (UVB) and ultraviolet C (UVC) light-emitting diodes (LEDs) with focus on the work done previously. Furthermore, approaches to improve the properties of such AlN/sapphire templates by the combination of high-temperature annealing (HTA) and patterned AlN/sapphire interfaces are discussed. While the beneficial effect of HTA is demonstrated for UVC LEDs, the growth of relaxed AlGaN buffer layers on HTA AlN is a challenge. To achieve relaxed AlGaN with a low dislocation density, the applicability of HTA for AlGaN is investigated. © 2020 The Authors. Published by WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Temperature Dependence of Dark Spot Diameters in GaN and AlGaN
2021, Netzel, Carsten, Knauer, Arne, Brunner, Frank, Mogilatenko, Anna, Weyers, Markus
Threading dislocations in c-plane (Al,Ga)N layers are surrounded by areas with reduced light generation efficiency, called “dark spots.” These areas are observable in luminescence measurements with spatial resolution in the submicrometer range. Dark spots reduce the internal quantum efficiency in single layers and light-emitting devices. In cathodoluminescence measurements, the diameter of dark spots (full width at half maximum [FWHM]) is observed to be 200–250 nm for GaN. It decreases by 30–60% for AlxGa1−xN with x ≈ 0.5. Furthermore, the dark spot diameter increases with increasing temperature from 83 to 300 K in AlGaN, whereas it decreases in GaN. Emission energy mappings around dark spots become less smooth and show sharper features on submicrometer scales at low temperature for AlGaN and, on the contrary, at high temperature for GaN. It is concluded that charge carrier localization dominates the temperature dependence of dark spot diameters and of the emission energy distribution around threading dislocations in AlGaN, whereas the temperature-dependent excitation volume in cathodoluminescence and charge carrier diffusion limited by phonon scattering are the dominant effects in GaN. Consequently, with increasing temperature, nonradiative recombination related to threading dislocations extends to wider regions in AlGaN, whereas it becomes spatially limited in GaN.
Comparison of Ultraviolet B Light‐Emitting Diodes with Single or Triple Quantum Wells
2021, Kolbe, Tim, Knauer, Arne, Ruschel, Jan, Rass, Jens, Kyong Cho, Hyun, Hagedorn, Sylvia, Glaab, Johannes, Lobo Ploch, Neysha, Einfeldt, Sven, Weyers, Markus
Light-emitting diodes (LEDs) with an emission wavelength of 310 nm containing either a single or a triple quantum well are compared regarding their efficiency and long-term stability. In addition, the influence of the thickness of the lower quantum well barrier and the quantum well thickness in single quantum well (SQW) LEDs is investigated. Electroluminescence measurements show a 28% higher initial output power for the SQW LEDs compared with the triple quantum well (TQW) LEDs because of larger spatial overlap of the carriers in the SQW as revealed by electro-optical simulations of the LED heterostructures. However, TQW LEDs show a higher output power than SQW LEDs after 1 h operation under harsh conditions. For SQW LEDs, it is found that for a thicker lower quantum well barrier (65 nm instead of 25 nm) the initial output power decreases by ≈15%. A thicker SQW (3 nm instead of 1.6 nm) reduces the initial output power by even 45% but increases the lifetime by a factor of 6 which is attributed to reduced Auger recombination from an enhanced spatial separation of electrons and holes in the quantum wells due to the quantum-confined Stark effect.