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- ItemFar field imaging of a dielectric inclusion(Bristol : IOP Publ., 2015) Wahab, Abdul; Ahmed, Naveed; Abbas, TasawarA non-iterative topological sensitivity framework for guaranteed far field detection of a dielectric inclusion is presented. The cases of single and multiple measurements of the electric far field scattering amplitude at a fixed frequency are taken into account. The performance of the algorithm is analyzed theoretically in terms of resolution, stability, and signal-to-noise ratio.