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    Classifying multi-model wheat yield impact response surfaces showing sensitivity to temperature and precipitation change
    (Amsterdam [u.a.] : Elsevier, 2017) Fronzek, Stefan; Pirttioja, Nina; Carter, Timothy R.; Bindi, Marco; Hoffmann, Holger; Palosuo, Taru; Ruiz-Ramos, Margarita; Tao, Fulu; Trnka, Miroslav; Acutis, Marco; Asseng, Senthold; Baranowski, Piotr; Basso, Bruno; Bodin, Per; Buis, Samuel; Cammarano, Davide; Deligios, Paola; Destain, Marie-France; Dumont, Benjamin; Ewert, Frank; Ferrise, Roberto; François, Louis; Gaiser, Thomas; Hlavinka, Petr; Jacquemin, Ingrid; Kersebaum, Kurt Christian; Kollas, Chris; Krzyszczak, Jaromir; Lorite, Ignacio J.; Minet, Julien; Minguez, M. Ines; Montesino, Manuel; Moriondo, Marco; Müller, Christoph; Nendel, Claas; Öztürk, Isik; Perego, Alessia; Rodríguez, Alfredo; Ruane, Alex C.; Ruget, Françoise; Sanna, Mattia; Semenov, Mikhail A.; Slawinski, Cezary; Stratonovitch, Pierre; Supit, Iwan; Waha, Katharina; Wang, Enli; Wu, Lianhai; Zhao, Zhigan; Rötter, Reimund P.
    Crop growth simulation models can differ greatly in their treatment of key processes and hence in their response to environmental conditions. Here, we used an ensemble of 26 process-based wheat models applied at sites across a European transect to compare their sensitivity to changes in temperature (−2 to +9°C) and precipitation (−50 to +50%). Model results were analysed by plotting them as impact response surfaces (IRSs), classifying the IRS patterns of individual model simulations, describing these classes and analysing factors that may explain the major differences in model responses. The model ensemble was used to simulate yields of winter and spring wheat at four sites in Finland, Germany and Spain. Results were plotted as IRSs that show changes in yields relative to the baseline with respect to temperature and precipitation. IRSs of 30-year means and selected extreme years were classified using two approaches describing their pattern. The expert diagnostic approach (EDA) combines two aspects of IRS patterns: location of the maximum yield (nine classes) and strength of the yield response with respect to climate (four classes), resulting in a total of 36 combined classes defined using criteria pre-specified by experts. The statistical diagnostic approach (SDA) groups IRSs by comparing their pattern and magnitude, without attempting to interpret these features. It applies a hierarchical clustering method, grouping response patterns using a distance metric that combines the spatial correlation and Euclidian distance between IRS pairs. The two approaches were used to investigate whether different patterns of yield response could be related to different properties of the crop models, specifically their genealogy, calibration and process description. Although no single model property across a large model ensemble was found to explain the integrated yield response to temperature and precipitation perturbations, the application of the EDA and SDA approaches revealed their capability to distinguish: (i) stronger yield responses to precipitation for winter wheat than spring wheat; (ii) differing strengths of response to climate changes for years with anomalous weather conditions compared to period-average conditions; (iii) the influence of site conditions on yield patterns; (iv) similarities in IRS patterns among models with related genealogy; (v) similarities in IRS patterns for models with simpler process descriptions of root growth and water uptake compared to those with more complex descriptions; and (vi) a closer correspondence of IRS patterns in models using partitioning schemes to represent yield formation than in those using a harvest index. Such results can inform future crop modelling studies that seek to exploit the diversity of multi-model ensembles, by distinguishing ensemble members that span a wide range of responses as well as those that display implausible behaviour or strong mutual similarities.
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    The Vulnerability, Impacts, Adaptation and Climate Services Advisory Board (VIACS AB v1.0) contribution to CMIP6
    (München : European Geopyhsical Union, 2016) Ruane, Alex C.; Teichmann, Claas; Arnell, Nigel W.; Carter, Timothy R.; Ebi, Kristie L.; Frieler, Katja; Goodess, Clare M.; Hewitson, Bruce; Horton, Radley; Kovats, R. Sari; Lotze, Heike K.; Mearns, Linda O.; Navarra, Antonio; Ojima, Dennis S.; Riahi, Keywan; Rosenzweig, Cynthia; Themessl, Matthias; Vincent, Katharine
    This paper describes the motivation for the creation of the Vulnerability, Impacts, Adaptation and Climate Services (VIACS) Advisory Board for the Sixth Phase of the Coupled Model Intercomparison Project (CMIP6), its initial activities, and its plans to serve as a bridge between climate change applications experts and climate modelers. The climate change application community comprises researchers and other specialists who use climate information (alongside socioeconomic and other environmental information) to analyze vulnerability, impacts, and adaptation of natural systems and society in relation to past, ongoing, and projected future climate change. Much of this activity is directed toward the co-development of information needed by decision-makers for managing projected risks. CMIP6 provides a unique opportunity to facilitate a two-way dialog between climate modelers and VIACS experts who are looking to apply CMIP6 results for a wide array of research and climate services objectives. The VIACS Advisory Board convenes leaders of major impact sectors, international programs, and climate services to solicit community feedback that increases the applications relevance of the CMIP6-Endorsed Model Intercomparison Projects (MIPs). As an illustration of its potential, the VIACS community provided CMIP6 leadership with a list of prioritized climate model variables and MIP experiments of the greatest interest to the climate model applications community, indicating the applicability and societal relevance of climate model simulation outputs. The VIACS Advisory Board also recommended an impacts version of Obs4MIPs and indicated user needs for the gridding and processing of model output.