2020, Zwiebler, M., Di Gennaro, E., Hamann-Borrero, J.E., Ritschel, T., Green, R.J., Sawatzky, G.A., Schierle, E., Weschke, E., Leo, A., Granozio, F. Miletto, Geck, J.

We present a combined resonant soft X-ray reflectivity and electric transport study of LaAlO 3/SrTiO 3 field effect devices. The depth profiles with atomic layer resolution that are obtained from the resonant reflectivity reveal a pronounced temperature dependence of the two-dimensional electron liquid at the LaAlO 3/SrTiO 3 interface. At room temperature the corresponding electrons are located close to the interface, extending down to 4 unit cells into the SrTiO 3 substrate. Upon cooling, however, these interface electrons assume a bimodal depth distribution: They spread out deeper into the SrTiO 3 and split into two distinct parts, namely one close to the interface with a thickness of about 4 unit cells and another centered around 9 unit cells from the interface. The results are consistent with theoretical predictions based on oxygen vacancies at the surface of the LaAlO 3 film and support the notion of a complex interplay between structural and electronic degrees of freedom. © 2020, The Author(s).