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Author: Flückiger, Leonie ×

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    XUV double-pulses with femtosecond to 650 ps separation from a multilayer-mirror-based split-and-delay unit at FLASH
    (Chester : IUCr, 2018-8-3) Sauppe, Mario; Rompotis, Dimitrios; Erk, Benjamin; Bari, Sadia; Bischoff, Tobias; Boll, Rebecca; Bomme, Cédric; Bostedt, Christoph; Dörner, Simon; Düsterer, Stefan; Feigl, Torsten; Flückiger, Leonie; Gorkhover, Tais; Kolatzki, Katharina; Langbehn, Bruno; Monserud, Nils; Müller, Erland; Müller, Jan P.; Passow, Christopher; Ramm, Daniel; Rolles, Daniel; Schubert, Kaja; Schwob, Lucas; Senfftleben, Björn; Treusch, Rolf; Ulmer, Anatoli; Weigelt, Holger; Zimbalski, Jannis; Zimmermann, Julian; Möller, Thomas; Rupp, Daniela
    Extreme ultraviolet (XUV) and X-ray free-electron lasers enable new scientific opportunities. Their ultra-intense coherent femtosecond pulses give unprecedented access to the structure of undepositable nanoscale objects and to transient states of highly excited matter. In order to probe the ultrafast complex light-induced dynamics on the relevant time scales, the multi-purpose end-station CAMP at the free-electron laser FLASH has been complemented by the novel multilayer-mirror-based split-and-delay unit DESC (DElay Stage for CAMP) for time-resolved experiments. XUV double-pulses with delays adjustable from zero femtoseconds up to 650 picoseconds are generated by reflecting under near-normal incidence, exceeding the time range accessible with existing XUV split-and-delay units. Procedures to establish temporal and spatial overlap of the two pulses in CAMP are presented, with emphasis on the optimization of the spatial overlap at long time-delays via time-dependent features, for example in ion spectra of atomic clusters.
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    Imaging plasma formation in isolated nanoparticles with ultrafast resonant scattering
    (Melville, NY : AIP Publishing LLC, 2020) Rupp, Daniela; Flückiger, Leonie; Adolph, Marcus; Colombo, Alessandro; Gorkhover, Tais; Harmand, Marion; Krikunova, Maria; Müller, Jan Philippe; Oelze, Tim; Ovcharenko, Yevheniy; Richter, Maria; Sauppe, Mario; Schorb, Sebastian; Treusch, Rolf; Wolter, David; Bostedt, Christoph; Möller, Thomas
    We have recorded the diffraction patterns from individual xenon clusters irradiated with intense extreme ultraviolet pulses to investigate the influence of light-induced electronic changes on the scattering response. The clusters were irradiated with short wavelength pulses in the wavelength regime of different 4d inner-shell resonances of neutral and ionic xenon, resulting in distinctly different optical properties from areas in the clusters with lower or higher charge states. The data show the emergence of a transient structure with a spatial extension of tens of nanometers within the otherwise homogeneous sample. Simulations indicate that ionization and nanoplasma formation result in a light-induced outer shell in the cluster with a strongly altered refractive index. The presented resonant scattering approach enables imaging of ultrafast electron dynamics on their natural timescale.