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- ItemRound robin comparison on quantitative nanometer scale magnetic field measurements by magnetic force microscopy(Amsterdam : Elsevier B.V., 2020) Hu, X.; Dai, G.; Sievers, S.; Fernández-Scarioni, A.; Corte-León, H.; Puttock, R.; Barton, C.; Kazakova, O.; Ulvr, M.; Klapetek, P.; Havlíček, M.; Nečas, D.; Tang, Y.; Neu, V.; Schumacher, H.W.Magnetic force microscopy (MFM) can be considered as a standard tool for nano-scale investigation of magnetic domain structures by probing the local stray magnetic field landscape of the measured sample. However, this generally provides only qualitative data. To quantify the stray magnetic fields, the MFM system must be calibrated. To that end, a transfer function (TF) approach was proposed, that, unlike point probe models, fully considers the finite extent of the MFM tip. However, albeit being comprehensive, the TF approach is not yet well established, mainly due to the ambiguities concerning the input parameters and the measurement procedure. Additionally, the calibration process represents an ill-posed problem which requires a regularization that introduces further parameters. In this paper we propose a guideline for quantitative stray field measurements by standard MFM tools in ambient conditions. All steps of the measurement and calibration procedure are detailed, including reference sample and sample under test (SUT) measurements and the data analysis. The suitability of the reference sample used in the present work for calibrated measurements on a sub-micron scale is discussed. A specific regularization approach based on a Pseudo-Wiener Filter is applied and combined with criteria for the numerical determination of a unique regularization parameter. To demonstrate the robustness of such a defined approach, a round robin comparison of magnetic field measurements was conducted by four laboratories. The guideline, the reference sample and the results of the round robin are discussed.
- ItemMetrological large range magnetic force microscopy(College Park, MD : American Institute of Physics, 2018) Dai, G.; Hu, X.; Sievers, S.; Fernández, Scarioni, A.; Neu, V.; Fluegge, J.; Schumacher, H.W.A new metrological large range magnetic force microscope (Met. LR-MFM) has been developed. In its design, the scanner motion is measured by using three laser interferometers along the x, y, and z axes. Thus, the scanner position and the lift height of the MFM can be accurately and traceably determined with subnanometer accuracy, allowing accurate and traceable MFM measurements. The Met. LR-MFM has a measurement range of 25 mm × 25 mm × 5 mm, larger than conventional MFMs by almost three orders of magnitude. It is capable of measuring samples from the nanoscale to the macroscale, and thus, it has the potential to bridge different magnetic field measurement tools having different spatially resolved scales. Three different measurement strategies referred to as Topo&MFM, MFMXY, and MFMZ have been developed. The Topo&MFM is designed for measuring topography and MFM phase images, similar to conventional MFMs. The MFMXY differs from the Topo&MFM as it does not measure the topography profile of surfaces at the second and successive lines, thus reducing tip wear and saving measurement time. The MFMZ allows the imaging of the stray field in the xz- or yz-planes. A number of measurement examples on a multilayered thin film reference sample made of [Co(0.4 nm)/Pt(0.9 nm)]100 and on a patterned magnetic multilayer [Co(0.4 nm)/Pt(0.9 nm)]10 with stripes with a 9.9 μm line width and 20 μm periodicity are demonstrated, indicating excellent measurement performance.
- ItemDetermination of tip transfer function for quantitative MFM using frequency domain filtering and least squares method(London : Nature Publishing Group, 2019) Nečas, D.; Klapetek, P.; Neu, V.; Havlíček, M.; Puttock, R.; Kazakova, O.; Hu, X.; Zajíčková, L.Magnetic force microscopy has unsurpassed capabilities in analysis of nanoscale and microscale magnetic samples and devices. Similar to other Scanning Probe Microscopy techniques, quantitative analysis remains a challenge. Despite large theoretical and practical progress in this area, present methods are seldom used due to their complexity and lack of systematic understanding of related uncertainties and recommended best practice. Use of the Tip Transfer Function (TTF) is a key concept in making Magnetic Force Microscopy measurements quantitative. We present a numerical study of several aspects of TTF reconstruction using multilayer samples with perpendicular magnetisation. We address the choice of numerical approach, impact of non-periodicity and windowing, suitable conventions for data normalisation and units, criteria for choice of regularisation parameter and experimental effects observed in real measurements. We present a simple regularisation parameter selection method based on TTF width and verify this approach via numerical experiments. Examples of TTF estimation are shown on both 2D and 3D experimental datasets. We give recommendations on best practices for robust TTF estimation, including the choice of windowing function, measurement strategy and dealing with experimental error sources. A method for synthetic MFM data generation, suitable for large scale numerical experiments is also presented.