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Author: Krikunova, Maria × Has files: Yes ×

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    THz streak camera performance for single-shot characterization of XUV pulses with complex temporal structures
    (Washington, DC : Soc., 2020) Oelze, Tim; Kulyk, Olena; Schütte, Bernd; Frühling, Ulrike; Klimešová, Eva; Jagielski, Bartholomäus; Dittrich, Laura; Drescher, Markus; Pan, Rui; Stojanovic, Nikola; Polovinkin, Vitaly; Khakurel, Krishna P.; Muehlig, Kerstin; Bermudez Macias, Ivette J.; Düsterer, Stefan; Faatz, Bart; Andreasson, Jakob; Wieland, Marek; Krikunova, Maria
    The THz-field-driven streak camera has proven to be a powerful diagnostic-technique that enables the shot-to-shot characterization of the duration and the arrival time jitter of free electron laser (FEL) pulses. Here we investigate the performance of three computational approaches capable to determine the duration of FEL pulses with complex temporal structures from single-shot measurements of up to three simultaneously recorded spectra. We use numerically simulated FEL pulses in order to validate the accuracy of the pulse length retrieval in average as well as in a single-shot mode. We discuss requirements for the THz field strength in order to achieve reliable results and compare our numerical study with the analysis of experimental data that were obtained at the FEL in Hamburg - FLASH. © 2020 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
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    Recombination dynamics of clusters in intense extreme-ultraviolet and near-infrared fields
    ([London] : IOP, 2015) Schütte, Bernd; Oelze, Tim; Krikunova, Maria; Arbeiter, Mathias; Fennel, Thomas; Vrakking, Marc J. J.; Rouzée, Arnaud
    We investigate electron-ion recombination processes in clusters exposed to intense extreme-ultraviolet (XUV) or near-infrared (NIR) pulses. Using the technique of reionization of excited atoms from recombination (REAR), recently introduced in Schütte et al (2014 Phys. Rev. Lett. 112 253401), a large population of excited atoms, which are formed in the nanoplasma during cluster expansion, is identified under both ionization conditions. For intense XUV ionization of clusters, we find that the significance of recombination increases for increasing cluster sizes. In addition, larger fragments are strongly affected by recombination as well, as shown for the case of dimers. We demonstrate that for mixed Ar–Xe clusters exposed to intense NIR pulses, excited atoms and ions are preferentially formed in the Xe core. As a result of electron-ion recombination, higher charge states of Xe are efficiently suppressed, leading to an overall reduced expansion speed of the cluster core in comparison to the shell.
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    Imaging plasma formation in isolated nanoparticles with ultrafast resonant scattering
    (Melville, NY : AIP Publishing LLC, 2020) Rupp, Daniela; Flückiger, Leonie; Adolph, Marcus; Colombo, Alessandro; Gorkhover, Tais; Harmand, Marion; Krikunova, Maria; Müller, Jan Philippe; Oelze, Tim; Ovcharenko, Yevheniy; Richter, Maria; Sauppe, Mario; Schorb, Sebastian; Treusch, Rolf; Wolter, David; Bostedt, Christoph; Möller, Thomas
    We have recorded the diffraction patterns from individual xenon clusters irradiated with intense extreme ultraviolet pulses to investigate the influence of light-induced electronic changes on the scattering response. The clusters were irradiated with short wavelength pulses in the wavelength regime of different 4d inner-shell resonances of neutral and ionic xenon, resulting in distinctly different optical properties from areas in the clusters with lower or higher charge states. The data show the emergence of a transient structure with a spatial extension of tens of nanometers within the otherwise homogeneous sample. Simulations indicate that ionization and nanoplasma formation result in a light-induced outer shell in the cluster with a strongly altered refractive index. The presented resonant scattering approach enables imaging of ultrafast electron dynamics on their natural timescale.
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    Correlated electronic decay in expanding clusters triggered by intense XUV pulses from a Free-Electron-Laser
    (London : Nature Publishing Group, 2017) Oelze, Tim; Schütte, Bernd; Müller, Maria; Müller, Jan P.; Wieland, Marek; Frühling, Ulrike; Drescher, Markus; Al-Shemmary, Alaa; Golz, Torsten; Stojanovic, Nikola; Krikunova, Maria
    Irradiation of nanoscale clusters and large molecules with intense laser pulses transforms them into highly-excited non- equilibrium states. The dynamics of intense laser-cluster interaction is encoded in electron kinetic energy spectra, which contain signatures of direct photoelectron emission as well as emission of thermalized nanoplasma electrons. In this work we report on a so far not observed spectrally narrow bound state signature in the electron kinetic energy spectra from mixed Xe core - Ar shell clusters ionized by intense extreme-ultraviolet (XUV) pulses from a free-electron-laser. This signature is attributed to the correlated electronic decay (CED) process, in which an excited atom relaxes and the excess energy is used to ionize the same or another excited atom or a nanoplasma electron. By applying the terahertz field streaking principle we demonstrate that CED-electrons are emitted at least a few picoseconds after the ionizing XUV pulse has ended. Following the recent finding of CED in clusters ionized by intense near-infrared laser pulses, our observation of CED in the XUV range suggests that this process is of general relevance for the relaxation dynamics in laser produced nanoplasmas.