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Author: Schütte, Bernd × Subject: Electrons ×

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Now showing 1 - 2 of 2
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    Correlated electronic decay following intense near-infrared ionization of clusters
    (Bristol : IOP Publ., 2015) Schütte, Bernd; Arbeiter, Mathias; Fennel, Thomas; Jabbari, Ghazal; Kuleff, Alexander I.; Vrakking, Marc J. J.; Rouzée, Arnaud
    We report on a novel correlated electronic decay process following extensive Rydberg atom formation in clusters ionized by intense near-infrared fields. A peak close to the atomic ionization potential is found in the electron kinetic energy spectrum. This new contribution is attributed to an energy transfer between two electrons, where one electron decays from a Rydberg state to the ground state and transfers its excess energy to a weakly bound cluster electron in the environment that can escape from the cluster. The process is a result of nanoplasma formation and is therefore expected to be important, whenever intense laser pulses interact with nanometer-sized particles.
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    THz streak camera performance for single-shot characterization of XUV pulses with complex temporal structures
    (Washington, DC : Soc., 2020) Oelze, Tim; Kulyk, Olena; Schütte, Bernd; Frühling, Ulrike; Klimešová, Eva; Jagielski, Bartholomäus; Dittrich, Laura; Drescher, Markus; Pan, Rui; Stojanovic, Nikola; Polovinkin, Vitaly; Khakurel, Krishna P.; Muehlig, Kerstin; Bermudez Macias, Ivette J.; Düsterer, Stefan; Faatz, Bart; Andreasson, Jakob; Wieland, Marek; Krikunova, Maria
    The THz-field-driven streak camera has proven to be a powerful diagnostic-technique that enables the shot-to-shot characterization of the duration and the arrival time jitter of free electron laser (FEL) pulses. Here we investigate the performance of three computational approaches capable to determine the duration of FEL pulses with complex temporal structures from single-shot measurements of up to three simultaneously recorded spectra. We use numerically simulated FEL pulses in order to validate the accuracy of the pulse length retrieval in average as well as in a single-shot mode. We discuss requirements for the THz field strength in order to achieve reliable results and compare our numerical study with the analysis of experimental data that were obtained at the FEL in Hamburg - FLASH. © 2020 Optical Society of America under the terms of the OSA Open Access Publishing Agreement