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Author: Seifert, Marietta × Subject: thin film ×

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Now showing 1 - 2 of 2
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    Surface effects and challenges for application of piezoelectric langasite substrates in surface acoustic wave devices caused by high temperature annealing under high vacuum
    (Basel : MDPI, 2015) Seifert, Marietta; Rane, Gayatri K.; Kirbus, Benjamin; Menzel, Siegfried B.; Gemming, Thomas
    Substrate materials that are high-temperature stable are essential for sensor devices which are applied at high temperatures. Although langasite is suggested as such a material, severe O and Ga diffusion into an O-affine deposited film was observed during annealing at high temperatures under vacuum conditions, leading to a damage of the metallization as well as a change of the properties of the substrate and finally to a failure of the device. Therefore, annealing of bare LGS (La 3 Ga 5 SiO 14 ) substrates at 800 ∘ C under high vacuum conditions is performed to analyze whether this pretreatment improves the suitability and stability of this material for high temperature applications in vacuum. To reveal the influence of the pretreatment on the subsequently deposited metallization, RuAl thin films are used as they are known to oxidize on LGS at high temperatures. A local study of the pretreated and metallized substrates using transmission electron microscopy reveals strong modification of the substrate surface. Micro cracks are visible. The composition of the substrate is strongly altered at those regions. Severe challenges for the application of LGS substrates under high-temperature vacuum conditions arise from these substrate damages, revealing that the pretreatment does not improve the applicability.
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    Micromagnetic investigation of domain and domain wall evolution through the spin-reorientation transition of an epitaxial NdCo5 film
    ([London] : IOP, 2017-3-1) Seifert, Marietta; Schultz, Ludwig; Schäfer, Rudolf; Hankemeier, Sebastian; Frömter, Robert; Oepen, Hans Peter; Neu, Volker
    The domain pattern and the domain wall microstructure throughout the spin-reorientation transition of an epitaxial NdCo5 thin film are investigated by micromagnetic simulations. The temperature-dependent anisotropy constants K1 and K2, which define the anisotropy energy term in the model, are chosen to reflect the easy axis—easy cone—easy plane spin-reorientation transition observed in epitaxial NdCo5 thin films. Starting at the high-temperature easy c-axis regime, the anisotropy constants are changed systematically corresponding to a lowering of the temperature of the system. The character of the domain walls and their profiles are analysed. The calculated domain configurations are compared to the experimentally observed temperature-dependent domain structure of an in-plane textured NdCo5 thin film.