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Author: Tomm, Jens W. × Has files: Yes ×

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    Temperature-Dependent Charge Carrier Diffusion in [0001¯] Direction of GaN Determined by Luminescence Evaluation of Buried InGaN Quantum Wells
    (Weinheim : Wiley-VCH, 2020) Netzel, Carsten; Hoffmann, Veit; Tomm, Jens W.; Mahler, Felix; Einfeldt, Sven; Weyers, Markus
    Temperature-dependent transport of photoexcited charge carriers through a nominally undoped, c-plane GaN layer toward buried InGaN quantum wells is investigated by continuous-wave and time-resolved photoluminescence spectroscopy. The excitation of the buried InGaN quantum wells is dominated by charge carrier diffusion through the GaN layer; photon recycling contributes only slightly. With temperature decreasing from 310 to 10 K, the diffusion length in [0001⎯⎯] direction increases from 250 to 600 nm in the GaN layer. The diffusion length at 300 K also increases from 100 to 300 nm when increasing the excitation power density from 20 to 500 W cm−2. The diffusion constant decreases from the low-temperature value of ∼7 to 1.5 cm2 s−1 at 310 K. The temperature dependence of the diffusion constant indicates that the diffusivity at room temperature is limited by optical phonon scattering. Consequently, higher diffusion constants in GaN-based devices require a reduced operation temperature. To increase diffusion lengths at a fixed temperature, the effective recombination time has to be prolonged by reducing the number of nonradiative recombination centers.
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    Zuverlässigkeitsanalytik brillanter Hochleistungs-Diodenlaser in industrierelevanten Betriebsregimen - TRUST : Schlussbericht des MBI ; Verbundprojekt TRUST im BRIOLAS-Projektverband
    (Hannover : Technische Informationsbibliothek (TIB), 2008) Tomm, Jens W.; Weik, Fritz; Ziegler, Mathias; Schwirzke-Schaaf, Sandy; Grunske, Tobias
    [no abstract available]
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    Dynamics of Broadband Lasing Cascade from a Single Dot-in-well InGaAs Microdisk
    ([London] : Macmillan Publishers Limited, part of Springer Nature, 2019) Talalaev, Vadim; Kryzhanovskaya, Natalia; Tomm, Jens W.; Rutckaia, Viktoriia; Schilling, Joerg; Zhukov, Alexey
    The development of a fast semiconductor laser is required for the realization of next-generation telecommunication applications. Since lasers operating on quantum dot ground state transitions exhibit only limited gain due to the saturation effect, we investigate lasing from excited states and compare its corresponding static and dynamic behavior to the one from the ground state. InAs quantum dots (QDs) grown in dot-in-well (DWELL) structures allowed to obtain light emission from ground and three excited states in a spectral range of 1.0–1.3 μm. This emission was coupled to whispering gallery modes (WGMs) of a 6 μm microdisk resonator and studied at room temperature by steady-state and time-resolved micro-photoluminescence. We demonstrate a cascade development of lasing arising from the ladder of quantum dot states, and compare the lasing behavior of ground and excited state emission. While the lasing threshold is being increased from the ground state to the highest excited state, the dynamic behavior is improved: turn-on times and lifetimes of WGMs become shorter paving the way towards high frequency direct driven microlasers. © 2019, The Author(s).