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    Analysis of a spin-polarized drift-diffusion model
    (Berlin : Weierstraß-Institut für Angewandte Analysis und Stochastik, 2008) Glitzky, Annegret
    We introduce a spin-polarized drift-diffusion model for semiconductor spintronic devices. This coupled system of continuity equations and a Poisson equation with mixed boundary conditions in all equations has to be considered in heterostructures. We give a weak formulation of this problem and prove an existence and uniqueness result for the instationary problem. If the boundary data is compatible with thermodynamic equilibrium the free energy along the solution decays monotonously and exponentially to its equilibrium value. In other cases it may be increasing but we estimate its growth. Moreover we give upper and lower estimates for the solution.
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    Electro-reaction-diffusion systems in heterostructures
    (Berlin : Weierstraß-Institut für Angewandte Analysis und Stochastik, 2000) Glitzky, Annegret; Hünlich, Rolf
    The paper is devoted to the mathematical investigation of a general class of electro-reaction-diffusion systems with nonsmooth data which arises in applications to semiconductor technology. Besides of a basic problem, a reduced problem is considered which is obtained if the kinetics of the free carriers is fast. For two dimensional domains we prove a global existence and uniqueness result. In addition, asymptotic properties of solutions are studied. Basic ideas are energy estimates, Moser iteration, regularization techniques and an existence result for electro-diffusion systems with weakly nonlinear volume and boundary source terms which is proved in the paper, too. The relationship between the property that the energy functional decays exponentially in time to its equilibrium value and the existence of global positive lower bounds for the densities of the species is investigated. We illustrate relations between the model and its reduced version in general and for concrete examples. Finally, we discuss the special features of heterostructures for simplified model problems.