Search Results

Now showing 1 - 10 of 11
Loading...
Thumbnail Image
Item

Revealing all states of dewetting of a thin gold layer on a silicon surface by nanosecond laser conditioning

2021, Ernst, Owen C., Uebel, David, Kayser, Stefan, Lange, Felix, Teubner, Thomas, Boeck, Torsten

Dewetting is a ubiquitous phenomenon which can be applied to the laser synthesis of nanoparticles. A classical spinodal dewetting process takes place in four successive states, which differ from each other in their morphology. In this study all states are revealed by interaction of pulsed nanosecond UV laser light with thin gold layers with thicknesses between 1 nm and 10 nm on (100) silicon wafers. The specific morphologies of the dewetting states are discussed with particular emphasis on the state boundaries. The main parameter determining which state is formed is not the duration for which the gold remains liquid, but rather the input energy provided by the laser. This shows that each state transition has a separate measurable activation energy. The temperature during the nanosecond pulses and the duration during which the gold remains liquid was determined by simulation using the COMSOL Multiphysics® software package. Using these calculations, an accurate local temperature profile and its development over time was simulated. An analytical study of the morphologies and formed structures was performed using Minkowski measures. With aid of this tool, the laser induced structures were compared with thermally annealed samples, with perfectly ordered structures and with perfectly random structures. The results show that both, structures of the laser induced and the annealed samples, strongly resemble the perfectly ordered structures. This reveals a close relationship between these structures and suggests that the phenomenon under investigation is indeed a spinodal dewetting generated by an internal material wave function. The purposeful generation of these structures and the elucidation of the underlying mechanism of dewetting by short pulse lasers may assist the realisation of various technical elements such as nanowires in science and industry. © 2020

Loading...
Thumbnail Image
Item

Current Status of Carbon‐Related Defect Luminescence in GaN

2021, Zimmermann, Friederike, Beyer, Jan, Röder, Christian, Beyer, Franziska C., Richter, Eberhard, Irmscher, Klaus, Heitmann, Johannes

Highly insulating layers are a prerequisite for gallium nitride (GaN)-based power electronic devices. For this purpose, carbon doping is one of the currently pursued approaches. However, its impact on the optical and electrical properties of GaN has been widely debated in the scientific community. For further improvement of device performance, a better understanding of the role of related defects is essential. To study optically active point defects, photoluminescence is one of the most frequently used experimental characterization techniques. Herein, the main recent advances in the attribution of carbon-related photoluminescence bands are reviewed, which were enabled by the interplay of a refinement of growth and characterization techniques and state-of-the-art first-principles calculations developed during the last decade. The predicted electronic structures of isolated carbon defects and selected carbon-impurity complexes are compared to experimental results. Taking into account both of these, a comprehensive overview on the present state of interpretation of carbon-related broad luminescence bands in bulk GaN is presented.

Loading...
Thumbnail Image
Item

Heading for brighter and faster β-Ga2O3 scintillator crystals

2022, Drozdowski, Winicjusz, Makowski, Michał, Bachiri, Abdellah, Witkowski, Marcin E., Wojtowicz, Andrzej J., Swiderski, Lukasz, Irmscher, Klaus, Schewski, Robert, Galazka, Zbigniew

Czochralski-grown β-Ga2O3 and β-Ga2O3:Si crystals with the free electron concentrations between 2.5·1016 and 4.3·1018 cm−3 have been characterized by means of pulse height and scintillation time profile measurements in order to assess their basic scintillation properties. At room temperature, with increasing free electron concentration in the studied range, the scintillation yields decrease from 8920 to 1930 ph/MeV, while the mean scintillation decay times pare down from 989 to 61 ns. However, when the brightest β-Ga2O3 sample is cooled down below 100 K, its scintillation yield exceeds 20000 ph/MeV.

Loading...
Thumbnail Image
Item

Characterization of inverted coaxial 76 Ge detectors in GERDA for future double- β decay experiments

2021, Agostini, M., Araujo, G., Bakalyarov, A.M., Balata, M., Barabanov, I., Baudis, L., Bauer, C., Bellotti, E., Belogurov, S., Bettini, A., Bezrukov, L., Wojcik, M., Yanovich, E., Zatschler, B., Zhitnikov, I., Zhukov, S.V., Zinatulina, D., Zschocke, A., Zsigmond, A.J., Zuber, K., Zuzel, G., Biancacci, V., Bossio, E., Bothe, V., Brudanin, V., Brugnera, R., Caldwell, A., Cattadori, C., Chernogorov, A., Comellato, T., D'Andrea, V., Demidova, E.V., Marco, N.D., Doroshkevich, E., Fischer, F., Fomina, M., Gangapshev, A., Garfagnini, A., Gooch, C., Grabmayr, P., Gurentsov, V., Gusev, K., Hakenmüller, J., Hemmer, S., Hofmann, W., Huang, J., Hult, M., Inzhechik, L.V., Janicskó Csáthy, J., Jochum, J., Junker, M., Kazalov, V., Kermaïdic, Y., Khushbakht, H., Kihm, T., Kirpichnikov, I.V., Klimenko, A., Kneißl, R., Knöpfle, K.T., Kochetov, O., Kornoukhov, V.N., Krause, P., Kuzminov, V.V., Laubenstein, M., Lindner, M., Lippi, I., Lubashevskiy, A., Lubsandorzhiev, B., Lutter, G., Macolino, C., Majorovits, B., Maneschg, W., Manzanillas, L., Miloradovic, M., Mingazheva, R., Misiaszek, M., Moseev, P., Müller, Y., Nemchenok, I., Pandola, L., Pelczar, K., Pertoldi, L., Piseri, P., Pullia, A., Ransom, C., Rauscher, L., Riboldi, S., Rumyantseva, N., Sada, C., Salamida, F., Schönert, S., Schreiner, J., Schütt, M., Schütz, A.-K., Schulz, O., Schwarz, M., Schwingenheuer, B., Selivanenko, O., Shevchik, E., Shirchenko, M., Shtembari, L., Simgen, H., Smolnikov, A., Stukov, D., Vasenko, A.A., Veresnikova, A., Vignoli, C., von Sturm, K., Wester, T., Wiesinger, C.

Neutrinoless double-β decay of 76Ge is searched for with germanium detectors where source and detector of the decay are identical. For the success of future experiments it is important to increase the mass of the detectors. We report here on the characterization and testing of five prototype detectors manufactured in inverted coaxial (IC) geometry from material enriched to 88% in 76Ge. IC detectors combine the large mass of the traditional semi-coaxial Ge detectors with the superior resolution and pulse shape discrimination power of point contact detectors which exhibited so far much lower mass. Their performance has been found to be satisfactory both when operated in vacuum cryostat and bare in liquid argon within the Gerda setup. The measured resolutions at the Q-value for double-β decay of 76Ge (Qββ = 2039 keV) are about 2.1 keV full width at half maximum in vacuum cryostat. After 18 months of operation within the ultra-low background environment of the GERmanium Detector Array (Gerda) experiment and an accumulated exposure of 8.5 kg⋅year, the background index after analysis cuts is measured to be 4.9+7.3−3.4×10−4 counts/(keV⋅kg⋅year) around Qββ. This work confirms the feasibility of IC detectors for the next-generation experiment Legend.

Loading...
Thumbnail Image
Item

Investigating the electrochemical stability of Li7La3Zr2O12 solid electrolytes using field stress experiments

2021, Smetaczek, Stefan, Pycha, Eva, Ring, Joseph, Siebenhofer, Matthäus, Ganschow, Steffen, Berendts, Stefan, Nenning, Andreas, Kubicek, Markus, Rettenwander, Daniel, Limbeck, Andreas, Fleig, Jürgen

Cubic Li7La3Zr2O12 (LLZO) garnets are among the most promising solid electrolytes for solid-state batteries with the potential to exceed conventional battery concepts in terms of energy density and safety. The electrochemical stability of LLZO is crucial for its application, however, controversial reports in the literature show that it is still an unsettled matter. Here, we investigate the electrochemical stability of LLZO single crystals by applying electric field stress via macro- and microscopic ionically blocking Au electrodes in ambient air. Induced material changes are subsequently probed using various locally resolved analysis techniques, including microelectrode electrochemical impedance spectroscopy (EIS), laser induced breakdown spectroscopy (LIBS), laser ablation-inductively coupled plasma-mass spectrometry (LA-ICP-MS), and microfocus X-ray diffraction (XRD). Our experiments indicate that LLZO decomposes at 4.1–4.3 V vs. Li+/Li, leading to the formation of Li-poor phases like La2Zr2O7 beneath the positively polarized electrode. The reaction is still on-going even after several days of polarization, indicating that no blocking interfacial layer is formed. The decomposition can be observed at elevated as well as room temperature and suggests that LLZO is truly not compatible with high voltage cathode materials.

Loading...
Thumbnail Image
Item

Melt Growth and Physical Properties of Bulk LaInO3 Single Crystals

2021, Galazka, Zbigniew, Irmscher, Klaus, Ganschow, Steffen, Zupancic, Martina, Aggoune, Wahib, Draxl, Claudia, Albrecht, Martin, Klimm, Detlef, Kwasniewski, Albert, Schulz, Tobias, Pietsch, Mike, Dittmar, Andrea, Grueneberg, Raimund, Juda, Uta, Schewski, Robert, Bergmann, Sabine, Cho, Hyeongmin, Char, Kookrin, Schroeder, Thomas, Bickermann, Matthias

Large bulk LaInO3 single crystals are grown from the melt contained within iridium crucibles by the vertical gradient freeze (VGF) method. The obtained crystals are undoped or intentionally doped with Ba or Ce, and enabled wafer fabrication of size 10 × 10 mm2. High melting point of LaInO3 (≈1880 °C) and thermal instability at high temperatures require specific conditions for bulk crystal growth. The crystals do not undergo any phase transition up to 1300 °C, above which a noticeable thermal decomposition takes place. The good structural quality of the crystals makes them suitable for epitaxy. The onset of strong optical absorption shows orientation-dependent behavior due to the orthorhombic symmetry of the LaInO3 crystals. Assuming direct transitions, optical bandgaps of 4.35 and 4.39 eV are obtained for polarizations along the [010] and the [100], [001] crystallographic directions, respectively. There is an additional weak absorption in the range between 2.8 and 4 eV due to oxygen vacancies. Density-functional-theory calculations support the interpretation of the optical absorption data. Cathodoluminescence spectra show a broad, structured emission band peaking at ≈2.2 eV. All bulk crystals are electrically insulating. The relative static dielectric constant is determined at a value of 24.6 along the [001] direction.

Loading...
Thumbnail Image
Item

Low Temperature Relaxation of Donor Bound Electron Spins in 28Si:P

2021, Sauter, E., Abrosimov, N.V., Hübner, J., Oestreich, M.

We measure the spin-lattice relaxation of donor bound electrons in ultrapure, isotopically enriched, phosphorus-doped 28Si:P. The optical pump-probe experiments reveal at low temperatures extremely long spin relaxation times which exceed 20 h. The 28Si:P spin relaxation rate increases linearly with temperature in the regime below 1 K and shows a distinct transition to a T9 dependence which dominates the spin relaxation between 2 and 4 K at low magnetic fields. The T7 dependence reported for natural silicon is absent. At high magnetic fields, the spin relaxation is dominated by the magnetic field dependent single phonon spin relaxation process. This process is well documented for natural silicon at finite temperatures but the 28Si:P measurements validate additionally that the bosonic phonon distribution leads at very low temperatures to a deviation from the linear temperature dependence of Γ as predicted by theory.

Loading...
Thumbnail Image
Item

High‐Temperature Annealing and Patterned AlN/Sapphire Interfaces

2021, Hagedorn, Sylvia, Mogilatenko, Anna, Walde, Sebastian, Pacak, Daniel, Weinrich, Jonas, Hartmann, Carsten, Weyers, Markus

Using the example of epitaxial lateral overgrowth of AlN on trench-patterned AlN/sapphire templates, the impact of introducing a high-temperature annealing step into the process chain is investigated. Covering the open surfaces of sapphire trench sidewalls with a thin layer of AlN is found to be necessary to preserve the trench shape during annealing. Both the influence of annealing temperature and annealing duration are investigated. To avoid the deformation of the AlN/sapphire interface during annealing, the annealing duration or annealing temperature must be low enough. Annealing for 1 h at 1730 °C is found to allow for the lowest threading dislocation density of 3.5 × 108 cm−2 in the subsequently grown AlN, while maintaining an uncracked smooth surface over the entire 2 in. wafer. Transmission electron microscopy study confirms the defect reduction by high-temperature annealing and reveals an additional strain relaxation mechanism by accumulation of horizontal dislocation lines at the interface between annealed and nonannealed AlN. By applying a second annealing step, the dislocation density can be further reduced to 2.5 × 108 cm−2.

Loading...
Thumbnail Image
Item

Sub-6 optical-cycle Kerr-lens mode-locked Tm:Lu2O3 and Tm:Sc2O3 combined gain media laser at 2.1 μm

2021, Suzuki, Anna, Kränkel, Christian, Tokurakawa, Masaki

We present a combined gain media Kerr-lens mode-locked laser based on a Tm:Lu2O3 ceramic and a Tm:Sc2O3 single crystal. Pulses as short as 41 fs, corresponding to less than 6 optical cycles, were obtained with an average output power of 42 mW at a wavelength of 2.1 μm and a repetition rate of 93.3 MHz. Furthermore, a maximum average power of 316 mW with a pulse duration of 73 fs was achieved.

Loading...
Thumbnail Image
Item

Reciprocal space slicing: A time-efficient approach to femtosecond x-ray diffraction

2021, Zeuschner, S.P., Mattern, M., Pudell, J.-E., von Reppert, A., Rössle, M., Leitenberger, W., Schwarzkopf, J., Boschker, J.E., Herzog, M., Bargheer, M.

An experimental technique that allows faster assessment of out-of-plane strain dynamics of thin film heterostructures via x-ray diffraction is presented. In contrast to conventional high-speed reciprocal space-mapping setups, our approach reduces the measurement time drastically due to a fixed measurement geometry with a position-sensitive detector. This means that neither the incident (ω) nor the exit ( 2θ ) diffraction angle is scanned during the strain assessment via x-ray diffraction. Shifts of diffraction peaks on the fixed x-ray area detector originate from an out-of-plane strain within the sample. Quantitative strain assessment requires the determination of a factor relating the observed shift to the change in the reciprocal lattice vector. The factor depends only on the widths of the peak along certain directions in reciprocal space, the diffraction angle of the studied reflection, and the resolution of the instrumental setup. We provide a full theoretical explanation and exemplify the concept with picosecond strain dynamics of a thin layer of NbO2.