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End date: 2009 × Start date: 2000 × Subject: Aberrations × WGL Institute: IPF ×

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    Advances for the topographic characterisation of SMC materials
    (Basel : MDPI, 2009) Calvimontes, A.; Grundke, K.; Müller, A.; Stamm, M.
    For a comprehensive study of Sheet Moulding Compound (SMC) surfaces, topographical data obtained by a contact-free optical method (chromatic aberration confocal imaging) were systematically acquired to characterise these surfaces with regard to their statistical, functional and volumetrical properties. Optimal sampling conditions (cut-off length and resolution) were obtained by a topographical-statistical procedure proposed in the present work. By using different length scales specific morphologies due to the influence of moulding conditions, metallic mould topography, glass fibre content and glass fibre orientation can be characterized. The aim of this study is to suggest a systematic topographical characterization procedure for composite materials in order to study and recognize the influence of production conditions on their surface quality. © 2009 by the authors.