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Now showing 1 - 4 of 4
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    Classifying multi-model wheat yield impact response surfaces showing sensitivity to temperature and precipitation change
    (Amsterdam [u.a.] : Elsevier, 2017) Fronzek, Stefan; Pirttioja, Nina; Carter, Timothy R.; Bindi, Marco; Hoffmann, Holger; Palosuo, Taru; Ruiz-Ramos, Margarita; Tao, Fulu; Trnka, Miroslav; Acutis, Marco; Asseng, Senthold; Baranowski, Piotr; Basso, Bruno; Bodin, Per; Buis, Samuel; Cammarano, Davide; Deligios, Paola; Destain, Marie-France; Dumont, Benjamin; Ewert, Frank; Ferrise, Roberto; François, Louis; Gaiser, Thomas; Hlavinka, Petr; Jacquemin, Ingrid; Kersebaum, Kurt Christian; Kollas, Chris; Krzyszczak, Jaromir; Lorite, Ignacio J.; Minet, Julien; Minguez, M. Ines; Montesino, Manuel; Moriondo, Marco; Müller, Christoph; Nendel, Claas; Öztürk, Isik; Perego, Alessia; Rodríguez, Alfredo; Ruane, Alex C.; Ruget, Françoise; Sanna, Mattia; Semenov, Mikhail A.; Slawinski, Cezary; Stratonovitch, Pierre; Supit, Iwan; Waha, Katharina; Wang, Enli; Wu, Lianhai; Zhao, Zhigan; Rötter, Reimund P.
    Crop growth simulation models can differ greatly in their treatment of key processes and hence in their response to environmental conditions. Here, we used an ensemble of 26 process-based wheat models applied at sites across a European transect to compare their sensitivity to changes in temperature (−2 to +9°C) and precipitation (−50 to +50%). Model results were analysed by plotting them as impact response surfaces (IRSs), classifying the IRS patterns of individual model simulations, describing these classes and analysing factors that may explain the major differences in model responses. The model ensemble was used to simulate yields of winter and spring wheat at four sites in Finland, Germany and Spain. Results were plotted as IRSs that show changes in yields relative to the baseline with respect to temperature and precipitation. IRSs of 30-year means and selected extreme years were classified using two approaches describing their pattern. The expert diagnostic approach (EDA) combines two aspects of IRS patterns: location of the maximum yield (nine classes) and strength of the yield response with respect to climate (four classes), resulting in a total of 36 combined classes defined using criteria pre-specified by experts. The statistical diagnostic approach (SDA) groups IRSs by comparing their pattern and magnitude, without attempting to interpret these features. It applies a hierarchical clustering method, grouping response patterns using a distance metric that combines the spatial correlation and Euclidian distance between IRS pairs. The two approaches were used to investigate whether different patterns of yield response could be related to different properties of the crop models, specifically their genealogy, calibration and process description. Although no single model property across a large model ensemble was found to explain the integrated yield response to temperature and precipitation perturbations, the application of the EDA and SDA approaches revealed their capability to distinguish: (i) stronger yield responses to precipitation for winter wheat than spring wheat; (ii) differing strengths of response to climate changes for years with anomalous weather conditions compared to period-average conditions; (iii) the influence of site conditions on yield patterns; (iv) similarities in IRS patterns among models with related genealogy; (v) similarities in IRS patterns for models with simpler process descriptions of root growth and water uptake compared to those with more complex descriptions; and (vi) a closer correspondence of IRS patterns in models using partitioning schemes to represent yield formation than in those using a harvest index. Such results can inform future crop modelling studies that seek to exploit the diversity of multi-model ensembles, by distinguishing ensemble members that span a wide range of responses as well as those that display implausible behaviour or strong mutual similarities.
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    Recent developments in the Inorganic Crystal Structure Database: theoretical crystal structure data and related features
    (Copenhagen : Munksgaard, 2019) Zagorac, D.; Müller, H.; Ruehl, S.; Zagorac, J.; Rehme, S.
    The Inorganic Crystal Structure Database (ICSD) is the world's largest database of fully evaluated and published crystal structure data, mostly obtained from experimental results. However, the purely experimental approach is no longer the only route to discover new compounds and structures. In the past few decades, numerous computational methods for simulating and predicting structures of inorganic solids have emerged, creating large numbers of theoretical crystal data. In order to take account of these new developments the scope of the ICSD was extended in 2017 to include theoretical structures which are published in peer-reviewed journals. Each theoretical structure has been carefully evaluated, and the resulting CIF has been extended and standardized. Furthermore, a first classification of theoretical data in the ICSD is presented, including additional categories used for comparison of experimental and theoretical information.
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    Classification and clustering: models, software and applications
    (Berlin : Weierstraß-Institut für Angewandte Analysis und Stochastik, 2009) Mucha, Hans-Joachim; Ritter, Gunter
    We are pleased to present the report on the 30th Fall Meeting of the working group ``Data Analysis and Numerical Classification'' (AG-DANK) of the German Classification Society. The meeting took place at the Weierstrass Institute for Applied Analysis and Stochastics (WIAS), Berlin, from Friday Nov. 14 till Saturday Nov. 15, 2008. Already 12 years ago, WIAS had hosted a traditional Fall Meeting with special focus on classification and multivariate graphics (Mucha and Bock, 1996). This time, the special topics were stability of clustering and classification, mixture decomposition, visualization, and statistical software.
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    Detecting ineffective features for pattern recognition
    (Oberwolfach : Mathematisches Forschungsinstitut Oberwolfach, 2017) Györfi, László; Walk, Harro
    For a binary classification problem, the hypothesis testing is studied, that a component of the observation vector is not effective, i.e., that component carries no information for the classification. We introduce nearest neighbor and partitioning estimates of the Bayes error probability, which result in a strongly consistent test.