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- ItemImpact of rare earth doping on the luminescence of lanthanum aluminum silicate glasses for radiation sensing(Washington, DC : OSA, 2022) Shaw, Ruth E.; Kalnins, Christopher A. G.; Whittaker, Carly A.; Moffatt, Jillian E.; Tsiminis, Georgios; Klantsataya, Elizaveta; Ottaway, David; Spooner, Nigel A.; Litzkendorf, Doris; Matthes, Anne; Schwuchow, Anka; Wondraczek, Katrin; Ebendorff-Heidepriem, HeikeLarge core soft glass fibers have been demonstrated to be promising candidates as intrinsic fiber sensors for radiation detection and dosimetry applications. Doping with rare earth ions enhanced their radiation sensitivity. SiO2-Al2O3-La2O3 (SAL) glasses offer easy fabrication of large core fibers with high rare earth concentration and higher mechanical strength than soft glasses. This paper evaluates the suitability of the SAL glass type for radiation dosimetry based on optically stimulated luminescence (OSL) via a comprehensive investigation of the spectroscopic and dosimetric properties of undoped and differently rare earth doped bulk SAL glass samples. Due to the low intensity of the rare earth luminescence peaks in the 250–400 nm OSL detection range, the OSL response for all the SAL glasses is not caused by the rare earth ions but by radiation-induced defects that act as intrinsic centers for the recombination of electrons and holes produced by the ionizing radiation, trapped in fabrication induced defect centers, and then released via stimulation with 470 nm light. The rare earth ions interfere with these processes involving intrinsic centers. This dosimetric behavior of highly rare earth doped SAL glasses suggests that enhancement of OSL response requires lower rare earth concentrations and/or longer wavelength OSL detection range.
- ItemAbsolute EUV reflectivity measurements using a broadband high-harmonic source and an in situ single exposure reference scheme(Washington, DC : Soc., 2022) Abel, Johann J.; Wiesner, Felix; Nathanael, Jan; Reinhard, Julius; Wünsche, Martin; Schmidl, Gabriele; Gawlik, Annett; Hübner, Uwe; Plentz, Jonathan; Rödel, Christian; Paulus, Gerhard G.; Fuchs, SilvioWe present a tabletop setup for extreme ultraviolet (EUV) reflection spectroscopy in the spectral range from 40 to 100 eV by using high-harmonic radiation. The simultaneous measurements of reference and sample spectra with high energy resolution provide precise and robust absolute reflectivity measurements, even when operating with spectrally fluctuating EUV sources. The stability and sensitivity of EUV reflectivity measurements are crucial factors for many applications in attosecond science, EUV spectroscopy, and nano-scale tomography. We show that the accuracy and stability of our in situ referencing scheme are almost one order of magnitude better in comparison to subsequent reference measurements. We demonstrate the performance of the setup by reflective near-edge x-ray absorption fine structure measurements of the aluminum L2/3 absorption edge in α-Al2O3 and compare the results to synchrotron measurements.