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End date: 2024 × Start date: 2020 × DDC: 530 × Subject: Electrons × WGL Institute: MBI ×

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Now showing 1 - 7 of 7
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    Ultrafast Structural Changes in Chiral Molecules Measured with Free-Electron Lasers
    (Bristol : IOP Publ., 2020) Schmidt, P.; Music, V.; Hartmann, G.; Boll, R.; Erk, B.; Bari, S.; Allum, F.; Baumann, T.M.; Brenner, G.; Brouard, M.; Burt, M.; Coffee, R.; Dörner, S.; Galler, A.; Grychtol, P.; Heathcote, D.; Inhester, L.; Kazemi, M.; Larsson, M.; Li, Z.; Lutmann, A.; Manschwetus, B.; Marder, L.; Mason, R.; Moeller, S.; Osipov, T.; Otto, H.; Passow, C.; Rolles, D.; Rupprecht, P.; Schubert, K.; Schwob, L.; Thomas, R.; Vallance, C.; Von Korff Schmising, C.; Wagner, R.; Walter, P.; Wolf, T.J.A.; Zhaunerchyk, V.; Meyer, M.; Ehresmann, A.; Knie, A.; Demekhin, P.V.; Ilchen, M.
    (X-ray) free-electron lasers are employed to site specifically interrogate atomic fragments during ultra-fast photolysis of chiral molecules via time-resolved photoelectron circular dichroism. © 2020 Institute of Physics Publishing. All rights reserved.
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    Sub-15-fs X-ray pump and X-ray probe experiment for the study of ultrafast magnetization dynamics in ferromagnetic alloys
    (Washington, DC : Soc., 2021) Liu, Xuan; Merhe, Alaaeldine; Jal, Emmanuelle; Delaunay, Renaud; Jarrier, Romain; Chardonnet, Valentin; Hennes, Marcel; Chiuzbaian, Sorin G.; Légaré, Katherine; Hennecke, Martin; Radu, Ilie; Von Korff Schmising, Clemens; Grunewald, Særen; Kuhlmann, Marion; Lüning, Jan; Vodungbo, Boris
    In this paper, we present a new setup for the measurement of element-specific ultrafast magnetization dynamics in ferromagnetic thin films with a sub-15-fs time resolution. Our experiment relies on a split and delay approach which allows us to fully exploit the shortest X-rays pulses delivered by X-ray Free Electrons Lasers (close to the attosecond range), in an X-ray pump – X-ray probe geometry. The setup performance is demonstrated by measuring the ultrafast elemental response of Ni and Fe during demagnetization of ferromagnetic Ni and Ni80Fe20 (Permalloy) samples upon resonant excitation at the corresponding absorption edges. The transient demagnetization process is measured in both reflection and transmission geometry using, respectively, the transverse magneto-optical Kerr effect (T-MOKE) and the Faraday effect as probing mechanisms.
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    Compact intense extreme-ultraviolet source
    (Washington, DC : OSA, 2021) Major, Balázs; Ghafur, Omair; Kovács, Katalin; Varjú, Katalin; Tosa, Valer; Vrakking, Marc J. J.; Schütte, B.
    High-intensity laser pulses covering the ultraviolet to terahertz spectral regions are nowadays routinely generated in a large number of laboratories. In contrast, intense extreme-ultraviolet (XUV) pulses have only been demonstrated using a small number of sources including free-electron laser facilities [1-3] and long high-harmonic generation (HHG) beamlines [4-9]. Here we demonstrate a concept for a compact intense XUV source based on HHG that is focused to an intensity of $2 \times 10^{14}$ W/cm$^2$, with a potential increase up to $10^{17}$ W/cm$^2$ in the future. Our approach uses tight focusing of the near-infrared (NIR) driving laser and minimizes the XUV virtual source size by generating harmonics several Rayleigh lengths away from the NIR focus. Accordingly, the XUV pulses can be refocused to a small beam waist radius of 600 nm, enabling the absorption of up to four XUV photons by a single Ar atom in a setup that fits on a modest (2 m) laser table. Our concept represents a straightforward approach for the generation of intense XUV pulses in many laboratories, providing novel opportunities for XUV strong-field and nonlinear optics experiments, for XUV-pump XUV-probe spectroscopy and for the coherent diffractive imaging of nanoscale structures.
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    Attosecond investigation of extreme-ultraviolet multi-photon multi-electron ionization
    (Washington, DC : OSA, 2022) Kretschmar, M.; Hadjipittas, A.; Major, B.; Tümmler, J.; Will, I.; Nagy, T.; Vrakking, M. J. J.; Emmanouilidou, A.; Schütte, B.
    Multi-electron dynamics in atoms and molecules very often occur on sub- to few-femtosecond time scales. The available intensities of extreme-ultraviolet (XUV) attosecond pulses have previously allowed the time-resolved investigation of two-photon, two-electron interactions. Here we study double and triple ionization of argon atoms involving the absorption of up to five XUV photons using a pair of intense attosecond pulse trains (APTs). By varying the time delay between the two APTs with attosecond precision and the spatial overlap with nanometer precision, we obtain information on complex nonlinear multi-photon ionization pathways. Our experimental and numerical results show that Ar2+ is predominantly formed by a sequential two-photon process, whereas the delay dependence of the Ar3+ ion yield exhibits clear signatures of the involvement of a simultaneous two-photon absorption process. Our experiment suggests that it is possible to investigate multi-electron dynamics using attosecond pulses for both pumping and probing the dynamics.
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    THz streak camera performance for single-shot characterization of XUV pulses with complex temporal structures
    (Washington, DC : Soc., 2020) Oelze, Tim; Kulyk, Olena; Schütte, Bernd; Frühling, Ulrike; Klimešová, Eva; Jagielski, Bartholomäus; Dittrich, Laura; Drescher, Markus; Pan, Rui; Stojanovic, Nikola; Polovinkin, Vitaly; Khakurel, Krishna P.; Muehlig, Kerstin; Bermudez Macias, Ivette J.; Düsterer, Stefan; Faatz, Bart; Andreasson, Jakob; Wieland, Marek; Krikunova, Maria
    The THz-field-driven streak camera has proven to be a powerful diagnostic-technique that enables the shot-to-shot characterization of the duration and the arrival time jitter of free electron laser (FEL) pulses. Here we investigate the performance of three computational approaches capable to determine the duration of FEL pulses with complex temporal structures from single-shot measurements of up to three simultaneously recorded spectra. We use numerically simulated FEL pulses in order to validate the accuracy of the pulse length retrieval in average as well as in a single-shot mode. We discuss requirements for the THz field strength in order to achieve reliable results and compare our numerical study with the analysis of experimental data that were obtained at the FEL in Hamburg - FLASH. © 2020 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
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    Real-time spatial characterization of micrometer-sized X-ray free-electron laser beams focused by bendable mirrors
    (Washington, DC : Soc., 2022) Mercurio, Giuseppe; Chalupský, Jaromír; Nistea, Ioana-Theodora; Schneider, Michael; Hájková, Věra; Gerasimova, Natalia; Carley, Robert; Cascella, Michele; Le Guyader, Loïc; Mercadier, Laurent; Schlappa, Justine; Setoodehnia, Kiana; Teichmann, Martin; Yaroslavtsev, Alexander; Burian, Tomáš; Vozda, Vojtĕch; Vyšín, Luděk; Wild, Jan; Hickin, David; Silenzi, Alessandro; Stupar, Marijan; Torben Delitz, Jan; Broers, Carsten; Reich, Alexander; Pfau, Bastian; Eisebitt, Stefan; La Civita, Daniele; Sinn, Harald; Vannoni, Maurizio; Alcock, Simon G.; Juha, Libor; Scherz, Andreas
    A real-time and accurate characterization of the X-ray beam size is essential to enable a large variety of different experiments at free-electron laser facilities. Typically, ablative imprints are employed to determine shape and size of μm-focused X-ray beams. The high accuracy of this state-of-the-art method comes at the expense of the time required to perform an ex-situ image analysis. In contrast, diffraction at a curved grating with suitably varying period and orientation forms a magnified image of the X-ray beam, which can be recorded by a 2D pixelated detector providing beam size and pointing jitter in real time. In this manuscript, we compare results obtained with both techniques, address their advantages and limitations, and demonstrate their excellent agreement. We present an extensive characterization of the FEL beam focused to ≈1 μm by two Kirkpatrick-Baez (KB) mirrors, along with optical metrology slope profiles demonstrating their exceptionally high quality. This work provides a systematic and comprehensive study of the accuracy provided by curved gratings in real-time imaging of X-ray beams at a free-electron laser facility. It is applied here to soft X-rays and can be extended to the hard X-ray range. Furthermore, curved gratings, in combination with a suitable detector, can provide spatial properties of μm-focused X-ray beams at MHz repetition rate.
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    Toward ultrafast magnetic depth profiling using time-resolved x-ray resonant magnetic reflectivity
    (Melville, NY : AIP Publishing LLC, 2021) Chardonnet, Valentin; Hennes, Marcel; Jarrier, Romain; Delaunay, Renaud; Jaouen, Nicolas; Kuhlmann, Marion; Ekanayake, Nagitha; Léveillé, Cyril; von Korff Schmising, Clemens; Schick, Daniel; Yao, Kelvin; Liu, Xuan; Chiuzbăian, Gheorghe S.; Lüning, Jan; Vodungbo, Boris; Jal, Emmanuelle
    During the last two decades, a variety of models have been developed to explain the ultrafast quenching of magnetization following femtosecond optical excitation. These models can be classified into two broad categories, relying either on a local or a non-local transfer of angular momentum. The acquisition of the magnetic depth profiles with femtosecond resolution, using time-resolved x-ray resonant magnetic reflectivity, can distinguish local and non-local effects. Here, we demonstrate the feasibility of this technique in a pump–probe geometry using a custom-built reflectometer at the FLASH2 free-electron laser (FEL). Although FLASH2 is limited to the production of photons with a fundamental wavelength of 4 nm (≃310 eV), we were able to probe close to the Fe L3 edge (706.8 eV) of a magnetic thin film employing the third harmonic of the FEL. Our approach allows us to extract structural and magnetic asymmetry signals revealing two dynamics on different time scales which underpin a non-homogeneous loss of magnetization and a significant dilation of 2 Å of the layer thickness followed by oscillations. Future analysis of the data will pave the way to a full quantitative description of the transient magnetic depth profile combining femtosecond with nanometer resolution, which will provide further insight into the microscopic mechanisms underlying ultrafast demagnetization.