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DDC: 620 × Publisher: College Park, MD : American Institute of Physics ×

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Now showing 1 - 3 of 3
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    Advances in magneto-ionic materials and perspectives for their application
    (College Park, MD : American Institute of Physics, 2021) Nichterwitz, M.; Honnali Sudheendra, S.; Kutuzau, M.; Guo, S.; Zehner, J.; Nielsch, K.; Leistner, K.
    The possibility of tuning magnetic material properties by ionic means is exciting both for basic science and, especially in view of the excellentenergy efficiency and room temperature operation, for potential applications. In this perspective, we shortly introduce the functionality ofmagneto-ionic materials and focus on important recent advances in this field. We present a comparative overview of state-of-the-art magneto-ionic materials considering the achieved magnetoelectric voltage coefficients for magnetization and coercivity and the demonstrated timescales for magneto-ionic switching. Furthermore, the application perspectives of magneto-ionic materials in data storage and computing,magnetic actuation, and sensing are evaluated. Finally, we propose potential research directions to push this field forward and tackle thechallenges related to future applications
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    Magnetoelectric materials, phenomena, and devices
    (College Park, MD : American Institute of Physics, 2021) Herrera Diez, L.; Kruk, R.; Leistner, K.; Sort, J.
    [no abstract available]
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    Metrological large range magnetic force microscopy
    (College Park, MD : American Institute of Physics, 2018) Dai, G.; Hu, X.; Sievers, S.; Fernández, Scarioni, A.; Neu, V.; Fluegge, J.; Schumacher, H.W.
    A new metrological large range magnetic force microscope (Met. LR-MFM) has been developed. In its design, the scanner motion is measured by using three laser interferometers along the x, y, and z axes. Thus, the scanner position and the lift height of the MFM can be accurately and traceably determined with subnanometer accuracy, allowing accurate and traceable MFM measurements. The Met. LR-MFM has a measurement range of 25 mm × 25 mm × 5 mm, larger than conventional MFMs by almost three orders of magnitude. It is capable of measuring samples from the nanoscale to the macroscale, and thus, it has the potential to bridge different magnetic field measurement tools having different spatially resolved scales. Three different measurement strategies referred to as Topo&MFM, MFMXY, and MFMZ have been developed. The Topo&MFM is designed for measuring topography and MFM phase images, similar to conventional MFMs. The MFMXY differs from the Topo&MFM as it does not measure the topography profile of surfaces at the second and successive lines, thus reducing tip wear and saving measurement time. The MFMZ allows the imaging of the stray field in the xz- or yz-planes. A number of measurement examples on a multilayered thin film reference sample made of [Co(0.4 nm)/Pt(0.9 nm)]100 and on a patterned magnetic multilayer [Co(0.4 nm)/Pt(0.9 nm)]10 with stripes with a 9.9 μm line width and 20 μm periodicity are demonstrated, indicating excellent measurement performance.