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DDC: 620 × Subject: Three orders of magnitude ×

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    Adaptable security in wireless sensor networks by using reconfigurable ECC hardware coprocessors
    (London : Hindawi, 2010) Portilla, J.; Otero, A.; de la Torre, E.; Riesgo, T.; Stecklina, O.; Peter, S.; Langendörfer, P.
    Specific features of Wireless Sensor Networks (WSNs) like the open accessibility to nodes, or the easy observability of radio communications, lead to severe security challenges. The application of traditional security schemes on sensor nodes is limited due to the restricted computation capability, low-power availability, and the inherent low data rate. In order to avoid dependencies on a compromised level of security, a WSN node with a microcontroller and a Field Programmable Gate Array (FPGA) is used along this work to implement a state-of-the art solution based on ECC (Elliptic Curve Cryptography). In this paper it is described how the reconfiguration possibilities of the system can be used to adapt ECC parameters in order to increase or reduce the security level depending on the application scenario or the energy budget. Two setups have been created to compare the softwareand hardware-supported approaches. According to the results, the FPGA-based ECC implementation requires three orders of magnitude less energy, compared with a low power microcontroller implementation, even considering the power consumption overhead introduced by the hardware reconfiguration.
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    Metrological large range magnetic force microscopy
    (College Park, MD : American Institute of Physics, 2018) Dai, G.; Hu, X.; Sievers, S.; Fernández, Scarioni, A.; Neu, V.; Fluegge, J.; Schumacher, H.W.
    A new metrological large range magnetic force microscope (Met. LR-MFM) has been developed. In its design, the scanner motion is measured by using three laser interferometers along the x, y, and z axes. Thus, the scanner position and the lift height of the MFM can be accurately and traceably determined with subnanometer accuracy, allowing accurate and traceable MFM measurements. The Met. LR-MFM has a measurement range of 25 mm × 25 mm × 5 mm, larger than conventional MFMs by almost three orders of magnitude. It is capable of measuring samples from the nanoscale to the macroscale, and thus, it has the potential to bridge different magnetic field measurement tools having different spatially resolved scales. Three different measurement strategies referred to as Topo&MFM, MFMXY, and MFMZ have been developed. The Topo&MFM is designed for measuring topography and MFM phase images, similar to conventional MFMs. The MFMXY differs from the Topo&MFM as it does not measure the topography profile of surfaces at the second and successive lines, thus reducing tip wear and saving measurement time. The MFMZ allows the imaging of the stray field in the xz- or yz-planes. A number of measurement examples on a multilayered thin film reference sample made of [Co(0.4 nm)/Pt(0.9 nm)]100 and on a patterned magnetic multilayer [Co(0.4 nm)/Pt(0.9 nm)]10 with stripes with a 9.9 μm line width and 20 μm periodicity are demonstrated, indicating excellent measurement performance.