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Type: Article × Subject: Optical sensors ×

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Now showing 1 - 3 of 3
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    Nanoscopic tip sensors fabricated by gas phase etching of optical glass fibers
    (Heidelberg : Springer, 2012) Bierlich, J.; Kobelke, J.; Brand, D.; Kirsch, K.; Dellith, J.; Bartelt, H.
    Silica-based fiber tips are used in a variety of spectroscopic, micro- or nano-scopic optical sensor applications and photonic micro-devices. The miniaturization of optical sensor systems and the technical implementation using optical fibers can provide new sensor designs with improved properties and functionality for new applications. The selective-etching of specifically doped silica fibers is a promising method in order to form complex photonic micro structures at the end or within fibers such as tips and cavities in various shapes useful for the all-fiber sensor and imaging applications. In the present study, we investigated the preparation of geometrically predefined, nanoscaled fiber tips by taking advantage of the dopant concentration profiles of highly doped step-index fibers. For this purpose, a gas phase etching process using hydrofluoric acid (HF) vapor was applied. The shaping of the fiber tips was based on very different etching rates as a result of the doping characteristics of specific optical fibers. Technological studies on the influence of the etching gas atmosphere on the temporal tip shaping and the final geometry were performed using undoped and doped silica fibers. The influence of the doping characteristics was investigated in phosphorus-, germanium-, fluorine- and boron-doped glass fibers. Narrow exposed as well as protected internal fiber tips in various shapes and tip radiuses down to less than 15 nm were achieved and characterized geometrically and topologically. For investigations into surface plasmon resonance effects, the fiber tips were coated with nanometer-sized silver layers by means of vapour deposition and finally subjected to an annealing treatment.
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    Reciprocal space slicing: A time-efficient approach to femtosecond x-ray diffraction
    (Melville, NY : AIP Publishing LLC, 2021) Zeuschner, S.P.; Mattern, M.; Pudell, J.-E.; von Reppert, A.; Rössle, M.; Leitenberger, W.; Schwarzkopf, J.; Boschker, J.E.; Herzog, M.; Bargheer, M.
    An experimental technique that allows faster assessment of out-of-plane strain dynamics of thin film heterostructures via x-ray diffraction is presented. In contrast to conventional high-speed reciprocal space-mapping setups, our approach reduces the measurement time drastically due to a fixed measurement geometry with a position-sensitive detector. This means that neither the incident (ω) nor the exit ( 2θ ) diffraction angle is scanned during the strain assessment via x-ray diffraction. Shifts of diffraction peaks on the fixed x-ray area detector originate from an out-of-plane strain within the sample. Quantitative strain assessment requires the determination of a factor relating the observed shift to the change in the reciprocal lattice vector. The factor depends only on the widths of the peak along certain directions in reciprocal space, the diffraction angle of the studied reflection, and the resolution of the instrumental setup. We provide a full theoretical explanation and exemplify the concept with picosecond strain dynamics of a thin layer of NbO2.
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    Giant refractometric sensitivity by combining extreme optical Vernier effect and modal interference
    ([London] : Macmillan Publishers Limited, part of Springer Nature, 2020) Gomes, André D.; Kobelke, Jens; Bierlich, Jörg; Dellith, Jan; Rothhardt, Manfred; Bartelt, Hartmut; Frazão, Orlando
    The optical Vernier effect consists of overlapping responses of a sensing and a reference interferometer with slightly shifted interferometric frequencies. The beating modulation thus generated presents high magnified sensitivity and resolution compared to the sensing interferometer, if the two interferometers are slightly out of tune with each other. However, the outcome of such a condition is a large beating modulation, immeasurable by conventional detection systems due to practical limitations of the usable spectral range. We propose a method to surpass this limitation by using a few-mode sensing interferometer instead of a single-mode one. The overlap response of the different modes produces a measurable envelope, whilst preserving an extremely high magnification factor, an order of magnification higher than current state-of-the-art performances. Furthermore, we demonstrate the application of that method in the development of a giant sensitivity fibre refractometer with a sensitivity of around 500 µm/RIU (refractive index unit) and with a magnification factor over 850.