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    Phase-resolved measurement of electric charge deposited by an atmospheric pressure plasma jet on a dielectric surface
    (Bristol : Institute of Physics Publishing, 2014) Wild, R.; Gerling, T.; Bussiahn, R.; Weltmann, K.-D.; Stollenwerk, L.
    The surface charge distribution deposited by the effluent of a dielectric barrier discharge driven atmospheric pressure plasma jet on a dielectric surface has been studied. For the first time, the deposition of charge was observed phase resolved. It takes place in either one or two events in each half cycle of the driving voltage. The charge transfer could also be detected in the electrode current of the jet. The periodic change of surface charge polarity has been found to correspond well with the appearance of ionized channels left behind by guided streamers (bullets) that have been identified in similar experimental situations. The distribution of negative surface charge turned out to be significantly broader than for positive charge. With increasing distance of the jet nozzle from the target surface, the charge transfer decreases until finally the effluent loses contact and the charge transfer stops.
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    Coulomb explosion of diatomic molecules in intense XUV fields mapped by partial covariance
    (Bristol : Institute of Physics Publishing, 2013) Kornilov, O.; Eckstein, M.; Rosenblatt, M.; Schulz, C.P.; Motomura, K.; Rouzée, A.; Klei, J.; Foucar, L.; Siano, M.; Lübcke, A.; Schapper, F.; Johnsson, P.; Holland, D.M.P.; Schlathölter, T.; Marchenko, T.; Düsterer, S.; Ueda, K.; Vrakking, M.J.J.; Frasinski, L.J.
    Single-shot time-of-flight spectra for Coulomb explosion of N2 and I2 molecules have been recorded at the Free Electron LASer in Hamburg (FLASH) and have been analysed using a partial covariance mapping technique. The partial covariance analysis unravels a detailed picture of all significant Coulomb explosion pathways, extending up to the N 4+-N5+ channel for nitrogen and up to the I 8+-I9+ channel for iodine. The observation of the latter channel is unexpected if only sequential ionization processes from the ground state ions are considered. The maximum kinetic energy release extracted from the covariance maps for each dissociation channel shows that Coulomb explosion of nitrogen molecules proceeds much faster than that of the iodine. The N 2 ionization dynamics is modelled using classical trajectory simulations in good agreement with the outcome of the experiments. The results suggest that covariance mapping of the Coulomb explosion can be used to measure the intensity and pulse duration of free-electron lasers.
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    Treatment of Candida albicans biofilms with low-temperature plasma induced by dielectric barrier discharge and atmospheric pressure plasma jet
    (College Park, MD : Institute of Physics Publishing, 2010) Koban, I.; Matthes, R.; Hübner, N.-O.; Welk, A.; Meisel, P.; Holtfreter, B.; Sietmann, R.; Kindel, E.; Weltmann, K.-D.; Kramer, A.; Kocher, T.
    Because of some disadvantages of chemical disinfection in dental practice (especially denture cleaning), we investigated the effects of physical methods on Candida albicans biofilms. For this purpose, the antifungal efficacy of three different low-temperature plasma devices (an atmospheric pressure plasma jet and two different dielectric barrier discharges (DBDs)) on Candida albicans biofilms grown on titanium discs in vitro was investigated. As positive treatment controls, we used 0.1% Chlorhexidine digluconate (CHX) and 0.6% sodium hypochlorite (NaOCl). The corresponding gas streams without plasma ignition served as negative treatment controls. The efficacy of the plasma treatment was determined evaluating the number of colony-forming units (CFU) recovered from titanium discs. The plasma treatment reduced the CFU significantly compared to chemical disinfectants. While 10 min CHX or NaOCl exposure led to a CFU log 10 reduction factor of 1.5, the log10 reduction factor of DBD plasma was up to 5. In conclusion, the use of low-temperature plasma is a promising physical alternative to chemical antiseptics for dental practice. © IOP Publishing Ltd and Deutsche Physikalische Gesellschaft.