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Publisher: Milton Park : Taylor & Francis × Subject: thin films ×

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    The properties of isolated chiral skyrmions in thin magnetic films
    (Milton Park : Taylor & Francis, 2016) Leonov, A.O.; Monchesky, T.L.; Romming, N.; Kubetzka, A.; Bogdanov, A.N.; Wiesendanger, R.
    Axisymmetric solitonic states (chiral skyrmions) were first predicted theoretically more than two decades ago. However, until recently they have been observed in a form of skyrmionic condensates (hexagonal lattices and other mesophases). In this paper we report experimental and theoretical investigations of isolated chiral skyrmions discovered in PdFe/Ir(111) bilayers two years ago by Romming et al (2013 Science 341 636). The results of spin-polarized scanning tunneling microscopy analyzed within the continuum and discrete models provide a consistent description of isolated skyrmions in thin layers. The existence region of chiral skyrmions is restricted by strip-out instabilities at low fields and a collapse at high fields. We demonstrate that the same equations describe axisymmetric localized states in all condensed matter systems with broken mirror symmetry, and thus our findings establish basic properties of isolated skyrmions common for chiral liquid crystals, different classes of noncentrosymmetric magnets, ferroelectrics, and multiferroics.
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    Electronic depth profiles with atomic layer resolution from resonant soft x-ray reflectivity
    (Milton Park : Taylor & Francis, 2015) Zwiebler, M.; Hamann-Borrero, J.E.; Vafaee, M.; Komissinskiy, P.; Macke, S.; Sutarto, R.; He, F.; Büchner, B.; Sawatzky, G.A.; Alff, L.; Geck, J.
    The analysis of x-ray reflectivity data from artificial heterostructures usually relies on the homogeneity of optical properties of the constituent materials. However, when the x-ray energy is tuned to the absorption edge of a particular resonant site, this assumption may no longer be appropriate. For samples realizing lattice planes with and without resonant sites, the corresponding regions containing the sites at resonance will have optical properties very different from regions without those sites. In this situation, models assuming homogeneous optical properties throughout the material can fail to describe the reflectivity adequately. As we show here, resonant soft x-ray reflectivity is sensitive to these variations, even though the wavelength is typically large as compared to the atomic distances over which the optical properties vary. We have therefore developed a scheme for analyzing resonant soft x-ray reflectivity data, which takes the atomic structure of a material into account by 'slicing' it into atomic planes with characteristic optical properties. Using LaSrMnO4 as an example, we discuss both the theoretical and experimental implications of this approach. Our analysis not only allows to determine important structural information such as interface terminations and stacking of atomic layers, but also enables to extract depth-resolved spectroscopic information with atomic resolution, thus enhancing the capability of the technique to study emergent phenomena at surfaces and interfaces.