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- ItemSite-controlled formation of single Si nanocrystals in a buried SiO2 matrix using ion beam mixing(Frankfurt am Main : Beilstein-Institut zur Förderung der Chemischen Wissenschaften, 2018) Xu, X.; Prüfer, T.; Wolf, D.; Engelmann, H.-J.; Bischoff, L.; Hübner, R.; Heinig, K.-H.; Möller, W.; Facsko, S.; von Borany, J.; Hlawacek, G.For future nanoelectronic devices - such as room-temperature single electron transistors - the site-controlled formation of single Si nanocrystals (NCs) is a crucial prerequisite. Here, we report an approach to fabricate single Si NCs via medium-energy Si+ or Ne+ ion beam mixing of Si into a buried SiO2 layer followed by thermally activated phase separation. Binary collision approximation and kinetic Monte Carlo methods are conducted to gain atomistic insight into the influence of relevant experimental parameters on the Si NC formation process. Energy-filtered transmission electron microscopy is performed to obtain quantitative values on the Si NC size and distribution in dependence of the layer stack geometry, ion fluence and thermal budget. Employing a focused Ne+ beam from a helium ion microscope, we demonstrate site-controlled self-assembly of single Si NCs. Line irradiation with a fluence of 3000 Ne+/nm2 and a line width of 4 nm leads to the formation of a chain of Si NCs, and a single NC with 2.2 nm diameter is subsequently isolated and visualized in a few nanometer thin lamella prepared by a focused ion beam (FIB). The Si NC is centered between the SiO2 layers and perpendicular to the incident Ne+ beam.
- ItemComputer modeling of single-layer nanocluster formation in a thin SiO2 layer buried in Si by ion mixing and thermal phase decomposition(College Park, MD : American Institute of Physics, 2019) Prüfer, T.; Möller, W.; Heinig, K.-H.; Wolf, D.; Engelmann, H.-J.; Xu, X.; Von Borany, J.A single sheet of Si nanoclusters with an average diameter of about 2 nm has been formed in a 30 nm Si/7 nm SiO2/Si layer stack by 50 and 60 keV Si+ ion-beam mixing at room temperature and fluences between 8.5 ⋯ 1015 and 2.6 ⋯ 1016 ions/cm2 and by subsequent thermal annealing at a temperature above 1000 °C. Computer modeling of the process is accomplished by TRIDYN dynamic ballistic simulation of ion mixing and subsequent lattice kinetic Monte Carlo simulation of the phase decomposition of substoichiometric silicon oxide into Si nanoclusters in a SiO2 matrix. The simulation algorithms are briefly described with special emphasis on the choice of governing parameters for the present system. In comparison to the experimental results, it is concluded that the predicted ion mixing profiles overestimate the interface broadening. This discrepancy is attributed to the neglect of chemical driving forces in connection with thermal-spike induced diffusion, which tends to reconstitute the Si/SiO2 interfaces. With a corresponding correction and a suitable number of Monte Carlo steps, the experimentally obtained areal densities and average diameters of the nanoclusters are successfully reproduced.
- ItemCarrier-envelope phase-tagged imaging of the controlled electron acceleration from SiO 2 nanospheres in intense few-cycle laser fields(Bristol : IOP, 2012) Zherebtsov, S.; Süßmann, F.; Peltz, C.; Plenge, J.; Betsch, K.J.; Znakovskaya, I.; Alnaser, A.S.; Johnson, N.G.; Kübel, M.; Horn, A.; Mondes, V.; Graf, C.; Trushin, S.A.; Azzeer, A.; Vrakking, M.J.J.; Paulus, G.G.; Krausz, F.; Rühl, E.; Fennel, T.; Kling, M.F.Waveform-controlled light fields offer the possibility of manipulating ultrafast electronic processes on sub-cycle timescales. The optical lightwave control of the collective electron motion in nanostructured materials is key to the design of electronic devices operating at up to petahertz frequencies. We have studied the directional control of the electron emission from 95 nm diameter SiO 2 nanoparticles in few-cycle laser fields with a well-defined waveform. Projections of the three-dimensional (3D) electron momentum distributions were obtained via single-shot velocity-map imaging (VMI), where phase tagging allowed retrieving the laser waveform for each laser shot. The application of this technique allowed us to efficiently suppress background contributions in the data and to obtain very accurate information on the amplitude and phase of the waveform-dependent electron emission. The experimental data that are obtained for 4 fs pulses centered at 720 nm at different intensities in the range (1-4)×10 13Wcm -2 are compared to quasi-classical mean-field Monte-Carlo simulations. The model calculations identify electron backscattering from the nanoparticle surface in highly dynamical localized fields as the main process responsible for the energetic electron emission from the nanoparticles. The local field sensitivity of the electron emission observed in our studies can serve as a foundation for future research on propagation effects for larger particles and field-induced material changes at higher intensities.
- ItemPercolation of rigid fractal carbon black aggregates(Melville, NY : American Institute of Physics, 2021) Coupette, Fabian; Zhang, Long; Kuttich, Björn; Chumakov, Andrei; Roth, Stephan V.; González-García, Lola; Kraus, Tobias; Schilling, TanjaWe examine network formation and percolation of carbon black by means of Monte Carlo simulations and experiments. In the simulation, we model carbon black by rigid aggregates of impenetrable spheres, which we obtain by diffusion-limited aggregation. To determine the input parameters for the simulation, we experimentally characterize the micro-structure and size distribution of carbon black aggregates. We then simulate suspensions of aggregates and determine the percolation threshold as a function of the aggregate size distribution. We observe a quasi-universal relation between the percolation threshold and a weighted average radius of gyration of the aggregate ensemble. Higher order moments of the size distribution do not have an effect on the percolation threshold. We conclude further that the concentration of large carbon black aggregates has a stronger influence on the percolation threshold than the concentration of small aggregates. In the experiment, we disperse the carbon black in a polymer matrix and measure the conductivity of the composite. We successfully test the hypotheses drawn from simulation by comparing composites prepared with the same type of carbon black before and after ball milling, i.e., on changing only the distribution of aggregate sizes in the composites.