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In situ surface acoustic wave field probing in microfluidic structures using optical transmission interferometry

2021, Weser, R., Schmidt, H.

The generation of mechanical driving forces in fluids at the microscale can be efficiently realized using acoustic actuators. For this purpose, bulk or surface acoustic waves (SAWs) are typically excited by an electroacoustic transducer, and the acoustic energy is subsequently coupled to the fluid. The resultant acoustic pressure field in the fluid allows for precise manipulation of immersed objects and also for the agitation of the fluid itself. In general, the fluidic actuation capability is mainly determined by the mechanical displacement amplitude at the interface between the fluid and the acoustically active surface. In the case of SAW-based actuators, the fluid most often is directly attached to the substrate surface along which the surface waves propagate. Hence, the lateral distribution of surface displacement amplitude, i.e., the surface acoustic wave field, at the fluid–substrate interface is of particular interest in order to achieve full control of the fluidic actuation. Here, we present a reliable experimental method for the in situ determination of the SAW field on fluid loaded substrate surfaces based on laser interferometry. The optical accessibility of the fluid–substrate interface is realized via transmission through the anisotropic, piezoelectric substrate material requiring only an additional calibration procedure in order to compensate the parasitic influence of effects based on different indices of refraction as well as on complex acousto-optic effects. Finally, the proposed method is demonstrated to yield reliable results of displacement amplitude on the fluid loaded surface and thus, to provide a valuable insight into acoustofluidic coupling that was not available so far.

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Huge impact of compressive strain on phase transition temperatures in epitaxial ferroelectric KxNa1-xNbO3 thin films

2019, Von Helden, L., Bogula, L., Janolin, P.-E., Hanke, M., Breuer, T., Schmidbauer, M., Ganschow, S., Schwarzkopf, J.

We present a study in which ferroelectric phase transition temperatures in epitaxial KxNa1-xNbO3 films are altered systematically by choosing different (110)-oriented rare-earth scandate substrates and by variation of the potassium to sodium ratio. Our results prove the capability to continuously shift the ferroelectric-to-ferroelectric transition from the monoclinic MC to orthorhombic c-phase by about 400 °C via the application of anisotropic compressive strain. The phase transition was investigated in detail by monitoring the temperature dependence of ferroelectric domain patterns using piezoresponse force microscopy and upon analyzing structural changes by means of high resolution X-ray diffraction including X-ray reciprocal space mapping. Moreover, the temperature evolution of the effective piezoelectric coefficient d33,f was determined using double beam laser interferometry, which exhibits a significant dependence on the particular ferroelectric phase. © 2019 Author(s).

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Metrological large range magnetic force microscopy

2018, Dai, G., Hu, X., Sievers, S., Fernández, Scarioni, A., Neu, V., Fluegge, J., Schumacher, H.W.

A new metrological large range magnetic force microscope (Met. LR-MFM) has been developed. In its design, the scanner motion is measured by using three laser interferometers along the x, y, and z axes. Thus, the scanner position and the lift height of the MFM can be accurately and traceably determined with subnanometer accuracy, allowing accurate and traceable MFM measurements. The Met. LR-MFM has a measurement range of 25 mm × 25 mm × 5 mm, larger than conventional MFMs by almost three orders of magnitude. It is capable of measuring samples from the nanoscale to the macroscale, and thus, it has the potential to bridge different magnetic field measurement tools having different spatially resolved scales. Three different measurement strategies referred to as Topo&MFM, MFMXY, and MFMZ have been developed. The Topo&MFM is designed for measuring topography and MFM phase images, similar to conventional MFMs. The MFMXY differs from the Topo&MFM as it does not measure the topography profile of surfaces at the second and successive lines, thus reducing tip wear and saving measurement time. The MFMZ allows the imaging of the stray field in the xz- or yz-planes. A number of measurement examples on a multilayered thin film reference sample made of [Co(0.4 nm)/Pt(0.9 nm)]100 and on a patterned magnetic multilayer [Co(0.4 nm)/Pt(0.9 nm)]10 with stripes with a 9.9 μm line width and 20 μm periodicity are demonstrated, indicating excellent measurement performance.