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B-T phase diagram of Pd/Fe/Ir(111) computed with parallel tempering Monte Carlo

2018, Böttcher, M., Heinze, S., Egorov, S., Sinova, J., Dupé, B.

We use an atomistic spin model derived from density functional theory calculations for the ultra-thin film Pd/Fe/Ir(111) to show that temperature induces coexisting non-zero skyrmion and antiskyrmion densities. We apply the parallel tempering Monte Carlo method in order to reliably compute thermodynamical quantities and the B–T phase diagram in the presence of frustrated exchange interactions. We evaluate the critical temperatures using the topological susceptibility. We show that the critical temperatures depend on the magnetic field in contrast to previous work. In total, we identify five phases: spin spiral, skyrmion lattice, ferromagnetic phase, intermediate region with finite topological charge and paramagnetic phase. To explore the effect of frustrated exchange interactions, we calculate the B–T phase diagram, when only effective exchange parameters are taken into account.

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Numerical study of the systematic error in Monte Carlo schemes for semiconductors

2008, Muscato, Orazio, Di Stefano, Vincenza, Wagner, Wolfgang

The paper studies the convergence behavior of Monte Carlo schemes for semiconductors. A detailed analysis of the systematic error with respect to numerical parameters is performed. Different sources of systematic error are pointed out and illustrated in a spatially one-dimensional test case. The error with respect to the number of simulation particles occurs during the calculation of the internal electric field. The time step error, which is related to the splitting of transport and electric field calculations, vanishes sufficiently fast. The error due to the approximation of the trajectories of particles depends on the ODE solver used in the algorithm. It is negligible compared to the other sources of time step error, when a second order Runge-Kutta solver is used. The error related to the approximate scattering mechanism is the most significant source of error with respect to the time step.