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Drift–diffusion simulation of S-shaped current–voltage relations for organic semiconductor devices

2020, Doan, Duy Hai, Fischer, Axel, Fuhrmann, Jürgen, Glitzky, Annegret, Liero, Matthias

We present an electrothermal drift–diffusion model for organic semiconductor devices with Gauss–Fermi statistics and positive temperature feedback for the charge carrier mobilities. We apply temperature-dependent Ohmic contact boundary conditions for the electrostatic potential and discretize the system by a finite volume based generalized Scharfetter–Gummel scheme. Using path-following techniques, we demonstrate that the model exhibits S-shaped current–voltage curves with regions of negative differential resistance, which were only recently observed experimentally. © 2020, The Author(s).

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Elektronenstruktur von Grenz- und Multischichten aus organischen Molekülen und Metallen : BMBF-Förderschwerpunkt: Erforschung der kondensierten Materie ; Großgeräte der physikalischen Grundlagenforschung ; Schlußbericht

2001, Fink, Jörg, Peisert, Heiko

[no abstract available]

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3D electrothermal simulations of organic LEDs showing negative differential resistance

2017, Liero, Matthias, Fuhrmann, Jürgen, Glitzky, Annegret, Koprucki, Thomas, Fischer, Axel, Reineke, Sebastian

Organic semiconductor devices show a pronounced interplay between temperature-activated conductivity and self-heating which in particular causes inhomogeneities in the brightness of large-area OLEDs at high power. We consider a 3D thermistor model based on partial differential equations for the electrothermal behavior of organic devices and introduce an extension to multiple layers with nonlinear conductivity laws, which also take the diode-like behavior in recombination zones into account. We present a numerical simulation study for a red OLED using a finite-volume approximation of this model. The appearance of S-shaped current-voltage characteristics with regions of negative differential resistance in a measured device can be quantitatively reproduced. Furthermore, this simulation study reveals a propagation of spatial zones of negative differential resistance in the electron and hole transport layers toward the contact.