2022, Mercurio, Giuseppe, Chalupský, Jaromír, Nistea, Ioana-Theodora, Schneider, Michael, Hájková, Věra, Gerasimova, Natalia, Carley, Robert, Cascella, Michele, Le Guyader, Loïc, Mercadier, Laurent, Schlappa, Justine, Setoodehnia, Kiana, Teichmann, Martin, Yaroslavtsev, Alexander, Burian, Tomáš, Vozda, Vojtĕch, Vyšín, Luděk, Wild, Jan, Hickin, David, Silenzi, Alessandro, Stupar, Marijan, Torben Delitz, Jan, Broers, Carsten, Reich, Alexander, Pfau, Bastian, Eisebitt, Stefan, La Civita, Daniele, Sinn, Harald, Vannoni, Maurizio, Alcock, Simon G., Juha, Libor, Scherz, Andreas

A real-time and accurate characterization of the X-ray beam size is essential to enable a large variety of different experiments at free-electron laser facilities. Typically, ablative imprints are employed to determine shape and size of μm-focused X-ray beams. The high accuracy of this state-of-the-art method comes at the expense of the time required to perform an ex-situ image analysis. In contrast, diffraction at a curved grating with suitably varying period and orientation forms a magnified image of the X-ray beam, which can be recorded by a 2D pixelated detector providing beam size and pointing jitter in real time. In this manuscript, we compare results obtained with both techniques, address their advantages and limitations, and demonstrate their excellent agreement. We present an extensive characterization of the FEL beam focused to ≈1 μm by two Kirkpatrick-Baez (KB) mirrors, along with optical metrology slope profiles demonstrating their exceptionally high quality. This work provides a systematic and comprehensive study of the accuracy provided by curved gratings in real-time imaging of X-ray beams at a free-electron laser facility. It is applied here to soft X-rays and can be extended to the hard X-ray range. Furthermore, curved gratings, in combination with a suitable detector, can provide spatial properties of μm-focused X-ray beams at MHz repetition rate.

2021, Zeuschner, S.P., Mattern, M., Pudell, J.-E., von Reppert, A., Rössle, M., Leitenberger, W., Schwarzkopf, J., Boschker, J.E., Herzog, M., Bargheer, M.

An experimental technique that allows faster assessment of out-of-plane strain dynamics of thin film heterostructures via x-ray diffraction is presented. In contrast to conventional high-speed reciprocal space-mapping setups, our approach reduces the measurement time drastically due to a fixed measurement geometry with a position-sensitive detector. This means that neither the incident (ω) nor the exit ( 2θ ) diffraction angle is scanned during the strain assessment via x-ray diffraction. Shifts of diffraction peaks on the fixed x-ray area detector originate from an out-of-plane strain within the sample. Quantitative strain assessment requires the determination of a factor relating the observed shift to the change in the reciprocal lattice vector. The factor depends only on the widths of the peak along certain directions in reciprocal space, the diffraction angle of the studied reflection, and the resolution of the instrumental setup. We provide a full theoretical explanation and exemplify the concept with picosecond strain dynamics of a thin layer of NbO2.