Structural properties of Co2TiSi films on GaAs(001)

dc.bibliographicCitation.issue22
dc.bibliographicCitation.journalTitleJournal of Applied Physicseng
dc.bibliographicCitation.volume120
dc.contributor.authorJenichen, B.
dc.contributor.authorHerfort, J.
dc.contributor.authorHanke, M.
dc.contributor.authorJahn, U.
dc.contributor.authorKong, X.
dc.contributor.authorDau, M.T.
dc.contributor.authorTrampert, A.
dc.contributor.authorKirmse, H.
dc.contributor.authorErwin, S.C.
dc.date.accessioned2018-01-18T01:01:42Z
dc.date.available2019-06-28T12:38:57Z
dc.date.issued2016
dc.description.abstractCo2TiSi films were grown by molecular beam epitaxy on GaAs(001) and analyzed using reflection high-energy electron diffraction, and electron microscopy. In addition, X-ray diffraction was combined with lattice parameter calculations by density functional theory comparing the L21 and B2 structures and considering the influence of non-stoichiometry. Columnar growth is found and attributed to inhomogeneous epitaxial strain from non-random alloying. In films with thicknesses up to 13 nm, these columns may be the origin of perpendicular magnetization with the easy axis perpendicular to the sample surface. We found L21 and B2 ordered regions, however the [Co]/[Ti]-ratio is changing in dependence of the position in the film. The resulting columnar structure is leading to anisotropic B2-ordering with the best order parallel to the axes of the columns.eng
dc.description.versionpublishedVersioneng
dc.formatapplication/pdf
dc.identifier.urihttps://doi.org/10.34657/1659
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/4141
dc.language.isoengeng
dc.publisherNew York : American Institute of Physicseng
dc.relation.doihttps://doi.org/10.1063/1.4971344
dc.rights.licenseCC BY 4.0 Unportedeng
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/eng
dc.subject.ddc530eng
dc.subject.otherCarbon dioxideeng
dc.subject.otherLattice constantseng
dc.subject.otherX-ray diffractioneng
dc.subject.otherEpitaxyeng
dc.subject.otherThin film growtheng
dc.titleStructural properties of Co2TiSi films on GaAs(001)eng
dc.typeArticleeng
dc.typeTexteng
tib.accessRightsopenAccesseng
wgl.contributorPDIeng
wgl.subjectPhysikeng
wgl.typeZeitschriftenartikeleng
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