Femtosecond time-resolved MeV electron diffraction

dc.bibliographicCitation.issue6eng
dc.bibliographicCitation.volume17
dc.contributor.authorZhu, Pengfei
dc.contributor.authorZhu, Y.
dc.contributor.authorHidaka, Y.
dc.contributor.authorWu, L.
dc.contributor.authorCao, J.
dc.contributor.authorBerger, H.
dc.contributor.authorGeck, J.
dc.contributor.authorKraus, R.
dc.contributor.authorPjerov, S.
dc.contributor.authorShen, Y.
dc.contributor.authorTobey, R.I.
dc.contributor.authorHill, J.P.
dc.contributor.authorWang, X.J.
dc.date.accessioned2018-06-11T16:43:53Z
dc.date.available2019-06-28T12:39:54Z
dc.date.issued2015
dc.description.abstractWe report the experimental demonstration of femtosecond electron diffraction using high-brightness MeV electron beams. High-quality, single-shot electron diffraction patterns for both polycrystalline aluminum and single-crystal 1T-TaS2 are obtained utilizing a 5 fC (~3 × 104 electrons) pulse of electrons at 2.8 MeV. The high quality of the electron diffraction patterns confirms that electron beam has a normalized emittance of ~50 nm rad. The transverse and longitudinal coherence length is ~11 and ~2.5 nm, respectively. The timing jitter between the pump laser and probe electron beam was found to be ~100 fs (rms). The temporal resolution is demonstrated by observing the evolution of Bragg and superlattice peaks of 1T-TaS2 following an 800 nm optical pump and was found to be 130 fs. Our results demonstrate the advantages of MeV electrons, including large elastic differential scattering cross-section and access to high-order reflections, and the feasibility of ultimately realizing below 10 fs time-resolved electron diffraction.eng
dc.description.versionpublishedVersioneng
dc.formatapplication/pdf
dc.identifier.urihttps://doi.org/10.34657/1498
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/4359
dc.language.isoengeng
dc.publisherMilton Park : Taylor & Franciseng
dc.relation.doihttps://doi.org/10.1088/1367-2630/17/6/063004
dc.relation.ispartofseriesNew Journal of Physics, Volume 17, Issue 6eng
dc.rights.licenseCC BY 3.0 Unportedeng
dc.rights.urihttps://creativecommons.org/licenses/by/3.0/eng
dc.subjectUltrafast electron diffractioneng
dc.subjecthigh-brightness electron beameng
dc.subjectcoherent lengtheng
dc.subjectultrafast electron imagingeng
dc.subject.ddc530eng
dc.titleFemtosecond time-resolved MeV electron diffractioneng
dc.typearticleeng
dc.typeTexteng
dcterms.bibliographicCitation.journalTitleNew Journal of Physicseng
tib.accessRightsopenAccesseng
wgl.contributorIFWDeng
wgl.subjectPhysikeng
wgl.typeZeitschriftenartikeleng
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