Quantitative multichannel NC-AFM data analysis of graphene growth on SiC(0001)
dc.bibliographicCitation.firstPage | 179 | eng |
dc.bibliographicCitation.journalTitle | Beilstein Journal of Nanotechnology | eng |
dc.bibliographicCitation.lastPage | 185 | eng |
dc.bibliographicCitation.volume | 3 | |
dc.contributor.author | Held, Christian | |
dc.contributor.author | Seyller, Thomas | |
dc.contributor.author | Bennewitz, Roland | |
dc.date.accessioned | 2016-03-24T17:38:44Z | |
dc.date.available | 2019-06-28T12:38:22Z | |
dc.date.issued | 2012 | |
dc.description.abstract | Noncontact atomic force microscopy provides access to several complementary signals, such as topography, damping, and contact potential. The traditional presentation of such data sets in adjacent figures or in colour-coded pseudo-three-dimensional plots gives only a qualitative impression. We introduce two-dimensional histograms for the representation of multichannel NC-AFM data sets in a quantitative fashion. Presentation and analysis are exemplified for topography and contact-potential data for graphene grown epitaxially on 6H-SiC(0001), as recorded by Kelvin probe force microscopy in ultrahigh vacuum. Sample preparations by thermal decomposition in ultrahigh vacuum and in an argon atmosphere are compared and the respective growth mechanisms discussed. | |
dc.description.version | publishedVersion | eng |
dc.format | application/pdf | |
dc.identifier.uri | https://doi.org/10.34657/1629 | |
dc.identifier.uri | https://oa.tib.eu/renate/handle/123456789/4000 | |
dc.language.iso | eng | eng |
dc.publisher | Frankfurt am Main : Beilstein-Institut | |
dc.relation.doi | https://doi.org/10.3762/bjnano.3.19 | |
dc.rights.license | CC BY-ND 3.0 Unported | eng |
dc.rights.uri | https://creativecommons.org/licenses/by-nd/3.0/ | eng |
dc.subject.ddc | 530 | |
dc.subject.other | FM-AFM | eng |
dc.subject.other | graphene | eng |
dc.subject.other | 6H-SiC(0001) | eng |
dc.subject.other | KPFM | eng |
dc.subject.other | SPM | eng |
dc.title | Quantitative multichannel NC-AFM data analysis of graphene growth on SiC(0001) | |
dc.type | Article | eng |
dc.type | Text | eng |
tib.accessRights | openAccess | eng |
wgl.contributor | INM | eng |
wgl.subject | Physik | eng |
wgl.type | Zeitschriftenartikel | eng |
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