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Macro- and micro-strain in GaN nanowires on Si(111)
dc.bibliographicCitation.journalTitle | Nanotechnology | eng |
dc.contributor.author | Jenichen, Bernd | |
dc.contributor.author | Brandt, Oliver | |
dc.contributor.author | Pfueller, Carsten | |
dc.contributor.author | Dogan, Pinar | |
dc.contributor.author | Knelangen, Mathias | |
dc.contributor.author | Trampert, Achim | |
dc.date.accessioned | 2016-03-24T17:38:01Z | |
dc.date.available | 2019-06-28T12:38:11Z | |
dc.date.issued | 2011 | |
dc.description.abstract | We analyze the strain state of GaN nanowire ensembles by x-ray diffraction. The nanowires are grown by molecular beam epitaxy on a Si(111) substrate in a self-organized manner. On a macroscopic scale, the nanowires are found to be free of strain. However, coalescence of the nanowires results in micro-strain with a magnitude from +-0.015% to +-0.03%.This micro-strain contributes to the linewidth observed in low-temperature photoluminescence spectra. | eng |
dc.description.version | publishedVersion | eng |
dc.identifier.uri | https://oa.tib.eu/renate/handle/123456789/3946 | |
dc.language.iso | eng | eng |
dc.publisher | Cambridge : arXiv | eng |
dc.relation.uri | http://arxiv.org/abs/1206.2525 | |
dc.rights.license | This document may be downloaded, read, stored and printed for your own use within the limits of § 53 UrhG but it may not be distributed via the internet or passed on to external parties. | eng |
dc.rights.license | Dieses Dokument darf im Rahmen von § 53 UrhG zum eigenen Gebrauch kostenfrei heruntergeladen, gelesen, gespeichert und ausgedruckt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden. | ger |
dc.subject.ddc | 530 | eng |
dc.title | Macro- and micro-strain in GaN nanowires on Si(111) | eng |
dc.type | Article | eng |
dc.type | Text | eng |
tib.accessRights | openAccess | eng |
wgl.contributor | PDI | eng |
wgl.subject | Physik | eng |
wgl.type | Zeitschriftenartikel | eng |