On the applicability of post-IR IRSL dating to Japanese loess

dc.bibliographicCitation.firstPage369eng
dc.bibliographicCitation.issue4eng
dc.bibliographicCitation.journalTitleGeochronometria : journal on methods and applications of absolute chronologyeng
dc.bibliographicCitation.lastPage378eng
dc.bibliographicCitation.volume38eng
dc.contributor.authorThiel, Christine
dc.contributor.authorBuylaert, Jan-Pieter
dc.contributor.authorMurray, Andrew
dc.contributor.authorTsukamoto, Sumiko
dc.date.accessioned2022-02-23T14:09:56Z
dc.date.available2022-02-23T14:09:56Z
dc.date.issued2011
dc.description.abstractRecent work on infrared stimulated luminescence (IRSL) dating has focussed on finding and testing signals which show less or negligible fading. IRSL signals measured at elevated temperature following IR stimulation at 50°C (post-IR IRSL) have been shown to be much more stable than the low temperature IRSL signal and seem to have considerable potential for dating. For Early Pleistocene samples of both European and Chinese loess natural post-IR IRSL signals lying in the saturation region of the laboratory dose response curve have been observed; this suggests that there is no significant fading in nature. As a contribution to the further testing of post-IR IRSL dating, we have used 18 samples from two Japanese loess profiles for which quartz OSL and tephra ages up to 600 ka provide age control. After a preheat of 320°C (60 s), the polymineral fine grains (4–11 μm) were bleached with IR at 50°C (200 s) and the IRSL was subsequently measured at 290°C for 200 s. In general, the fading uncorrected post-IR IRSL ages agree with both the quartz OSL and the tephra ages. We conclude that the post-IR IRSL signal from these samples does not fade significantly and allows precise and accurate age determinations on these sediments.eng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/8069
dc.identifier.urihttps://doi.org/10.34657/7110
dc.language.isoengeng
dc.publisherWarsaw : De Gruytereng
dc.relation.doihttps://doi.org/10.2478/s13386-011-0043-4
dc.relation.essn1897-1695
dc.rights.licenseCC BY-NC-ND 3.0 Unportedeng
dc.rights.urihttps://creativecommons.org/licenses/by-nc-nd/3.0/eng
dc.subject.ddc620eng
dc.subject.ddc690eng
dc.subject.otherFadingeng
dc.subject.otherJapanese loesseng
dc.subject.otherPost-IR IRSL datingeng
dc.titleOn the applicability of post-IR IRSL dating to Japanese loesseng
dc.typeArticleeng
dc.typeTexteng
tib.accessRightsopenAccesseng
wgl.contributorLIAGeng
wgl.subjectIngenieurwissenschafteneng
wgl.typeZeitschriftenartikeleng
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