The Weak 3D Topological Insulator Bi12Rh3Sn3I9
dc.bibliographicCitation.firstPage | 15549 | eng |
dc.bibliographicCitation.issue | 67 | eng |
dc.bibliographicCitation.journalTitle | Chemistry - A European Journal | eng |
dc.bibliographicCitation.lastPage | 15557 | eng |
dc.bibliographicCitation.volume | 26 | eng |
dc.contributor.author | Lê Anh, Mai | |
dc.contributor.author | Kaiser, Martin | |
dc.contributor.author | Ghimire, Madhav Prasad | |
dc.contributor.author | Richter, Manuel | |
dc.contributor.author | Koepernik, Klaus | |
dc.contributor.author | Gruschwitz, Markus | |
dc.contributor.author | Tegenkamp, Christoph | |
dc.contributor.author | Doert, Thomas | |
dc.contributor.author | Ruck, Michael | |
dc.date.accessioned | 2021-08-23T09:35:27Z | |
dc.date.available | 2021-08-23T09:35:27Z | |
dc.date.issued | 2020 | |
dc.description.abstract | Topological insulators (TIs) gained high interest due to their protected electronic surface states that allow dissipation-free electron and information transport. In consequence, TIs are recommended as materials for spintronics and quantum computing. Yet, the number of well-characterized TIs is rather limited. To contribute to this field of research, we focused on new bismuth-based subiodides and recently succeeded in synthesizing a new compound Bi12Rh3Sn3I9, which is structurally closely related to Bi14Rh3I9 – a stable, layered material. In fact, Bi14Rh3I9 is the first experimentally supported weak 3D TI. Both structures are composed of well-defined intermetallic layers of ∞2[(Bi4Rh)3I]2+ with topologically protected electronic edge-states. The fundamental difference between Bi14Rh3I9 and Bi12Rh3Sn3I9 lies in the composition and the arrangement of the anionic spacer. While the intermetallic 2D TI layers in Bi14Rh3I9 are isolated by ∞1[Bi2I8]2− chains, the isoelectronic substitution of bismuth(III) with tin(II) leads to ∞2[Sn3I8]2− layers as anionic spacers. First transport experiments support the 2D character of this material class and revealed metallic conductivity. © 2020 The Authors. Published by Wiley-VCH GmbH | eng |
dc.description.version | updatedVersion | eng |
dc.identifier.uri | https://oa.tib.eu/renate/handle/123456789/6564 | |
dc.identifier.uri | https://doi.org/10.34657/5611 | |
dc.language.iso | eng | eng |
dc.publisher | Weinheim : Wiley-VCH | eng |
dc.relation.doi | https://doi.org/10.1002/chem.202001953 | |
dc.relation.essn | 1521-3765 | |
dc.relation.issn | 0947-6539 | |
dc.rights.license | CC BY 4.0 Unported | eng |
dc.rights.uri | https://creativecommons.org/licenses/by/4.0/ | eng |
dc.subject.ddc | 540 | eng |
dc.subject.ddc | 660 | eng |
dc.subject.other | crystal growth | eng |
dc.subject.other | crystal structure | eng |
dc.subject.other | topological band gap | eng |
dc.subject.other | topological insulators | eng |
dc.subject.other | weak topological insulators | eng |
dc.title | The Weak 3D Topological Insulator Bi12Rh3Sn3I9 | eng |
dc.type | Article | eng |
dc.type | Text | eng |
tib.accessRights | openAccess | eng |
wgl.contributor | IFWD | eng |
wgl.subject | Chemie | eng |
wgl.type | Zeitschriftenartikel | eng |
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