An existence result for a class of electrothermal drift-diffusion models with Gauss--Fermi statistics for organic semiconductors

dc.bibliographicCitation.seriesTitleWIAS Preprintseng
dc.bibliographicCitation.volume2593
dc.contributor.authorGlitzky, Annegret
dc.contributor.authorLiero, Matthias
dc.contributor.authorNika, Grigor
dc.date.accessioned2022-06-23T09:38:50Z
dc.date.available2022-06-23T09:38:50Z
dc.date.issued2019
dc.description.abstractThis work is concerned with the analysis of a drift-diffusion model for the electrothermal behavior of organic semiconductor devices. A "generalized Van Roosbroeck'' system coupled to the heat equation is employed, where the former consists of continuity equations for electrons and holes and a Poisson equation for the electrostatic potential, and the latter features source terms containing Joule heat contributions and recombination heat. Special features of organic semiconductors like Gauss--Fermi statistics and mobilities functions depending on the electric field strength are taken into account. We prove the existence of solutions for the stationary problem by an iteration scheme and Schauder's fixed point theorem. The underlying solution concept is related to weak solutions of the Van Roosbroeck system and entropy solutions of the heat equation. Additionally, for data compatible with thermodynamic equilibrium, the uniqueness of the solution is verified. It was recently shown that self-heating significantly influences the electronic properties of organic semiconductor devices. Therefore, modeling the coupled electric and thermal responses of organic semiconductors is essential for predicting the effects of temperature on the overall behavior of the device. This work puts the electrothermal drift-diffusion model for organic semiconductors on a sound analytical basis.eng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/9167
dc.identifier.urihttps://doi.org/10.34657/8205
dc.language.isoeng
dc.publisherBerlin : Weierstraß-Institut für Angewandte Analysis und Stochastik
dc.relation.doihttps://doi.org/10.20347/WIAS.PREPRINT.2593
dc.relation.hasversionhttps://doi.org/10.1142/S0219530519500246
dc.relation.issn2198-5855
dc.rights.licenseThis document may be downloaded, read, stored and printed for your own use within the limits of § 53 UrhG but it may not be distributed via the internet or passed on to external parties.eng
dc.rights.licenseDieses Dokument darf im Rahmen von § 53 UrhG zum eigenen Gebrauch kostenfrei heruntergeladen, gelesen, gespeichert und ausgedruckt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden.ger
dc.subject.ddc510
dc.subject.otherDrift-diffusion systemeng
dc.subject.otherheat floweng
dc.subject.othercharge and heat transporteng
dc.subject.otherentropy solutionseng
dc.subject.otherexistence of weak solutionseng
dc.subject.otherorganic semiconductoreng
dc.subject.otherGauss--Fermi statisticseng
dc.titleAn existence result for a class of electrothermal drift-diffusion models with Gauss--Fermi statistics for organic semiconductorseng
dc.typeReporteng
dc.typeTexteng
dcterms.extent22 S.
tib.accessRightsopenAccess
wgl.contributorWIAS
wgl.subjectMathematik
wgl.typeReport / Forschungsbericht / Arbeitspapier
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