Self-Replication of Deeply Buried Doped Silicon Structures, which Remotely Control the Etching Process: A New Method for Forming a Silicon Pattern from the Bottom Up
dc.bibliographicCitation.firstPage | 2100105 | eng |
dc.bibliographicCitation.issue | 25 | eng |
dc.bibliographicCitation.journalTitle | Advanced Functional Materials | eng |
dc.bibliographicCitation.volume | 31 | eng |
dc.contributor.author | Schutzeichel, Christopher | |
dc.contributor.author | Kiriy, Nataliya | |
dc.contributor.author | Kiriy, Anton | |
dc.contributor.author | Voit, Brigitte | |
dc.date.accessioned | 2021-11-25T10:19:15Z | |
dc.date.available | 2021-11-25T10:19:15Z | |
dc.date.issued | 2021 | |
dc.description.abstract | A typical microstructuring process utilizes photolithographic masks to create arbitrary patterns on silicon substrates in a top-down approach. Herein, a new, bottom-up microstructuring method is reported, which enables the patterning of n-doped silicon substrates to be performed without the need for application of etch-masks or stencils during the etching process. Instead, the structuring process developed herein involves a simple alkaline etching performed under illumination and is remotely controlled by the p-doped micro-sized implants, buried beneath a homogeneous n-doped layer at depths of 0.25 to 1 µm. The microstructuring is realized because the buried implants act upon illumination as micro-sized photovoltaic cells, which generate a flux of electrons and increase the negative surface charge in areas above the implants. The locally increased surface charge causes a local protection of the native silicon oxide layer from alkaline etching, which ultimately leads to the microstructuring of the substrate. In this way, substrates having at their top a thick layer of homogeneously n-doped silicon can be structured, reducing the need for costly, time-consuming photolithography steps. © 2021 The Authors. Advanced Functional Materials published by Wiley-VCH GmbH | eng |
dc.description.version | publishedVersion | eng |
dc.identifier.uri | https://oa.tib.eu/renate/handle/123456789/7480 | |
dc.identifier.uri | https://doi.org/10.34657/6527 | |
dc.language.iso | eng | eng |
dc.publisher | Weinheim : Wiley-VCH | eng |
dc.relation.doi | https://doi.org/10.1002/adfm.202100105 | |
dc.relation.essn | 1099-0712 | |
dc.relation.essn | 1616-3028 | |
dc.rights.license | CC BY 4.0 Unported | eng |
dc.rights.uri | https://creativecommons.org/licenses/by/4.0/ | eng |
dc.subject.ddc | 620 | eng |
dc.subject.ddc | 540 | eng |
dc.subject.ddc | 530 | eng |
dc.subject.other | lithography | eng |
dc.subject.other | patterning | eng |
dc.subject.other | photo etching | eng |
dc.subject.other | self-replication | eng |
dc.subject.other | silicon etching | eng |
dc.title | Self-Replication of Deeply Buried Doped Silicon Structures, which Remotely Control the Etching Process: A New Method for Forming a Silicon Pattern from the Bottom Up | eng |
dc.type | Article | eng |
dc.type | Text | eng |
tib.accessRights | openAccess | eng |
wgl.contributor | IPF | eng |
wgl.subject | Ingenieurwissenschaften | eng |
wgl.type | Zeitschriftenartikel | eng |
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