Surface charge measurements on different dielectrics in diffuse and filamentary barrier discharges

dc.bibliographicCitation.firstPage105207
dc.bibliographicCitation.issue10
dc.bibliographicCitation.journalTitleJournal of physics : D, Applied physicseng
dc.bibliographicCitation.volume50
dc.contributor.authorTschiersch, R.
dc.contributor.authorNemschokmichal, S.
dc.contributor.authorBogaczyk, M.
dc.contributor.authorMeichsner, J.
dc.date.accessioned2023-01-11T14:14:01Z
dc.date.available2023-01-11T14:14:01Z
dc.date.issued2017-2-10
dc.description.abstractPreviously, we reported on the measurement of surface charges during the operation of barrier discharges (BDs) using the electro-optic Pockels effect of a bismuth silicon oxide (BSO) crystal. With the present work, the next milestone is achieved by making this powerful method accessible to various dielectrics which are typically used in BD configurations. The dynamics and spatial distribution of positive and negative surface charges were determined on optically transparent borosilicate glass, mono-crystalline alumina and magnesia, respectively, covering the BSO crystal. By variation of the nitrogen admixture to helium and the pressure between 500 mbar and 1 bar, both the diffuse glow-like BD and the self-stabilized discharge filaments were operated inside of a gas gap of 3 mm. The characteristics of the discharge and, especially, the influence of the different dielectrics on its development were studied by surface charge diagnostics, electrical measurements and ICCD camera imaging. Regarding the glow-like BD, the breakdown voltage changes significantly by variation of the cathodic dielectric, due to the different effective secondary electron emission (SEE) coefficients. These material-specific SEE yields were estimated using Townsend's criterion in combination with analytical calculations of the effective ionization coefficient in helium with air impurities. Moreover, the importance of the surface charge memory effect for the self-stabilization of discharge filaments was quantified by the recalculated spatio-temporal behavior of the gap voltage.eng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/10830
dc.identifier.urihttp://dx.doi.org/10.34657/9856
dc.language.isoeng
dc.publisherBristol : IOP Publ.
dc.relation.doihttps://doi.org/10.1088/1361-6463/aa5605
dc.relation.essn1361-6463
dc.relation.issn0022-3727
dc.rights.licenseCC BY 3.0 Unported
dc.rights.urihttps://creativecommons.org/licenses/by/3.0
dc.subject.ddc530
dc.subject.otheraluminaeng
dc.subject.otherbarrier dischargeeng
dc.subject.otherborosilicateeng
dc.subject.othergap voltageeng
dc.subject.othermagnesiaeng
dc.subject.othermemory effecteng
dc.subject.othersecondary electron emission coefficienteng
dc.subject.othersurface chargeeng
dc.titleSurface charge measurements on different dielectrics in diffuse and filamentary barrier dischargeseng
dc.typeArticleeng
dc.typeTexteng
tib.accessRightsopenAccesseng
wgl.contributorINP
wgl.subjectPhysikger
wgl.typeZeitschriftenartikelger
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