Huge impact of compressive strain on phase transition temperatures in epitaxial ferroelectric KxNa1-xNbO3 thin films

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dc.bibliographicCitation.firstPage232905eng
dc.bibliographicCitation.issue23eng
dc.bibliographicCitation.journalTitleApplied Physics Letterseng
dc.bibliographicCitation.volume114eng
dc.contributor.authorVon Helden, L.
dc.contributor.authorBogula, L.
dc.contributor.authorJanolin, P.-E.
dc.contributor.authorHanke, M.
dc.contributor.authorBreuer, T.
dc.contributor.authorSchmidbauer, M.
dc.contributor.authorGanschow, S.
dc.contributor.authorSchwarzkopf, J.
dc.date.accessioned2021-10-21T09:08:17Z
dc.date.available2021-10-21T09:08:17Z
dc.date.issued2019
dc.description.abstractWe present a study in which ferroelectric phase transition temperatures in epitaxial KxNa1-xNbO3 films are altered systematically by choosing different (110)-oriented rare-earth scandate substrates and by variation of the potassium to sodium ratio. Our results prove the capability to continuously shift the ferroelectric-to-ferroelectric transition from the monoclinic MC to orthorhombic c-phase by about 400 °C via the application of anisotropic compressive strain. The phase transition was investigated in detail by monitoring the temperature dependence of ferroelectric domain patterns using piezoresponse force microscopy and upon analyzing structural changes by means of high resolution X-ray diffraction including X-ray reciprocal space mapping. Moreover, the temperature evolution of the effective piezoelectric coefficient d33,f was determined using double beam laser interferometry, which exhibits a significant dependence on the particular ferroelectric phase. © 2019 Author(s).eng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/7080
dc.identifier.urihttps://doi.org/10.34657/6127
dc.language.isoengeng
dc.publisherMelville, NY : American Inst. of Physicseng
dc.relation.doihttps://doi.org/10.1063/1.5094405
dc.relation.essn1077-3118
dc.relation.issn0003-6951
dc.rights.licenseCC BY 4.0 Unportedeng
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/eng
dc.subject.ddc530eng
dc.subject.otherFerroelectric filmseng
dc.subject.otherFerroelectric materialseng
dc.subject.otherFerroelectricityeng
dc.subject.otherLaser interferometryeng
dc.subject.otherNiobium compoundseng
dc.subject.otherPiezoelectricityeng
dc.subject.otherRare earthseng
dc.subject.otherScanning probe microscopyeng
dc.subject.otherSodium compoundseng
dc.subject.otherTemperature distributioneng
dc.subject.otherX ray diffraction analysiseng
dc.subject.otherEpitaxial ferroelectriceng
dc.subject.otherFerroelectric phase transition temperatureseng
dc.subject.otherFerroelectric transitioneng
dc.subject.otherHigh resolution X ray diffractioneng
dc.subject.otherMonitoring the temperatureseng
dc.subject.otherPiezoelectric coefficienteng
dc.subject.otherPiezoresponse force microscopyeng
dc.subject.otherX-ray reciprocal space mappingeng
dc.subject.otherPotassium compoundseng
dc.titleHuge impact of compressive strain on phase transition temperatures in epitaxial ferroelectric KxNa1-xNbO3 thin filmseng
dc.typeArticleeng
dc.typeTexteng
tib.accessRightsopenAccesseng
wgl.contributorIKZeng
wgl.contributorPDIeng
wgl.subjectPhysikeng
wgl.typeZeitschriftenartikeleng
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